sz_jlc_inductor.dcm

EESchema-DOCLIB  Version 2.0
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$CMP 2.2uH,±10%,0603,C1033
D test description,
K test key,
F ~
$ENDCMP
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$CMP 4.7uH,±10%,0603,C1034
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10uH,±10%,0603,C1035
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1uH,±10%,0805,C1042
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2.2uH,±10%,0805,C1043
D test description,
K test key,
F ~
$ENDCMP
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$CMP 4.7uH,±10%,0805,C1044
D test description,
K test key,
F ~
$ENDCMP
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$CMP 5.6uH,±10%,0805,C1045
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10uH,±10%,0805,C1046
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1uH,±10%,1206,C1047
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2.2uH,±10%,1206,C1048
D test description,
K test key,
F ~
$ENDCMP
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$CMP 4.7uH,±10%,1206,C1049
D test description,
K test key,
F ~
$ENDCMP
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$CMP 5.6uH,±10%,1206,C1050
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10uH,±10%,1206,C1051
D test description,
K test key,
F ~
$ENDCMP
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$CMP 33nH,±5%,600mA,0603,C11774
D test description,
K test key,
F ~
$ENDCMP
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$CMP 68nH,±5%,0805,C11775
D test description,
K test key,
F ~
$ENDCMP
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$CMP 39nH,±5%,0603,C12327
D test description,
K test key,
F ~
$ENDCMP
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$CMP 39nH,±5%,0805,C12328
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1uH,±10%,0603,C12374
D test description,
K test key,
F ~
$ENDCMP
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$CMP 3.3uH,±10%,0603,C12589
D test description,
K test key,
F ~
$ENDCMP
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$CMP 22nH,±5%,0402,C12670
D test description,
K test key,
F ~
$ENDCMP
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$CMP 47uH,±10%,0805,C14304
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10nH,±5%,300mA,0805,C14457
D test description,
K test key,
F ~
$ENDCMP
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$CMP 22nH,±5%,0805,C14459
D test description,
K test key,
F ~
$ENDCMP
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$CMP 18nH,±5%,300mA,0805,C14460
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.5uH,±10%,1206,C15581
D test description,
K test key,
F ~
$ENDCMP
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$CMP 33uH,±10%,0805,C18101
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2nH,±0.3nH,900mA,0402,C18216
D test description,
K test key,
F ~
$ENDCMP
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$CMP 3.6nH,±0.3nH,750mA,0402,C19216
D test description,
K test key,
F ~
$ENDCMP
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$CMP 6.8nH,±0.2nH,200mA,0603,C19227
D test description,
K test key,
F ~
$ENDCMP
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$CMP 3nH,±0.3nH,0402,C19898
D test description,
K test key,
F ~
$ENDCMP
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$CMP 600Ω±25%,100MHz,0603,C20345
D test description,
K test key,
F ~
$ENDCMP
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$CMP 12uH,±10%,3mA,0603,C21306
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10nH,±5%,0402,C21585
D test description,
K test key,
F ~
$ENDCMP
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$CMP 36nH,±5%,0805,C21941
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1uH,±5%,400mA,1210,C22202
D test description,
K test key,
F ~
$ENDCMP
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$CMP 4.7nH,±0.1nH,160mA,0402,C23769
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2.7uH,±10%,30mA,0805,C24183
D test description,
K test key,
F ~
$ENDCMP
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$CMP 47uH,±10%,1206,C26910
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.8uH,±10%,1210,C27774
D test description,
K test key,
F ~
$ENDCMP
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$CMP 100uH,±20%,1210,C27775
D test description,
K test key,
F ~
$ENDCMP
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$CMP 330nH,±10%,250mA,0805,C29069
D test description,
K test key,
F ~
$ENDCMP
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$CMP 18uH,±5%,1210,C295126
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2.7uH,±10%,0603,C29946
D test description,
K test key,
F ~
$ENDCMP
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$CMP 390nH,±10%,0805,C29972
D test description,
K test key,
F ~
$ENDCMP
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$CMP 330nH,±10%,250mA,0805,C30617
D test description,
K test key,
F ~
$ENDCMP
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$CMP 150nH,±10%,250mA,0805,C30618
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10uH,±5%,1210,C31961
D test description,
K test key,
F ~
$ENDCMP
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$CMP 22uH,±10%,0805,C32375
D test description,
K test key,
F ~
$ENDCMP
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$CMP 100nH,±5%,0805,C32878
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.1nH,±0.3nH,400mA,0402,C33115
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2.2uH,±5%,1210,C36828
D test description,
K test key,
F ~
$ENDCMP
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$CMP 560nH,±5%,230mA,0805,C37297
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2nH,±0.3nH,500mA,0603,C40464
D test description,
K test key,
F ~
$ENDCMP
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$CMP 3nH,±0.3nH,0603,C40465
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.8uH,±5%,350mA,1210,C41039
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2.2uH,±5%,350mA,0805,C41651
D test description,
K test key,
F ~
$ENDCMP
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$CMP 18uH,±10%,0805,C42027
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.8uH,±10%,1206,C43936
D test description,
K test key,
F ~
$ENDCMP
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$CMP 24nH,±5%,300mA,0603,C47614
D test description,
K test key,
F ~
$ENDCMP
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$CMP 30nH,±0.3nH,300mA,0603,C47615
D test description,
K test key,
F ~
$ENDCMP
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$CMP 0.47uH,±10%,0805,C48556
D test description,
K test key,
F ~
$ENDCMP
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$CMP 36nH,±5%,300mA,0603,C48589
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2.2uH,±10%,0402,C49067
D test description,
K test key,
F ~
$ENDCMP
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$CMP 100nH,±5%,0603,C49329
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1uH,±10%,0603,C49810
D test description,
K test key,
F ~
$ENDCMP
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$CMP 3.3uH±10%,0805,C51725
D test description,
K test key,
F ~
$ENDCMP
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$CMP 36nH,±5%,150mA,0402,C52050
D test description,
K test key,
F ~
$ENDCMP
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$CMP 3.3uH,±10%,50mA,1206,C52707
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2.2uH,±20%,900mA,0805,C55755
D test description,
K test key,
F ~
$ENDCMP
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$CMP 27nH,±5%,0805,C56586
D test description,
K test key,
F ~
$ENDCMP
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$CMP 4.7uH,±5%,220mA,1210,C56767
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6uH,±10%,5mA,0603,C57837
D test description,
K test key,
F ~
$ENDCMP
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$CMP 15uH,±10%,1mA,0603,C57838
D test description,
K test key,
F ~
$ENDCMP
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$CMP 18uH,±10%,0603,C57839
D test description,
K test key,
F ~
$ENDCMP
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$CMP 22uH,±10%,1mA,0603,C57840
D test description,
K test key,
F ~
$ENDCMP
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$CMP 27uH,±10%,1mA,0603,C57841
D test description,
K test key,
F ~
$ENDCMP
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$CMP 470uH,±5%,1210,C63833
D test description,
K test key,
F ~
$ENDCMP
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$CMP 22uH,±10%,1206,C64476
D test description,
K test key,
F ~
$ENDCMP
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$CMP 47uH,,±5%,,60mA,1210,C66936
D test description,
K test key,
F ~
$ENDCMP
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$CMP 100uH,±10%,0805,C68035
D test description,
K test key,
F ~
$ENDCMP
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$CMP 22nH,±5%,0603,C71649
D test description,
K test key,
F ~
$ENDCMP
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$CMP 0.82uH,±10%,0603,C74313
D test description,
K test key,
F ~
$ENDCMP
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$CMP 4.7uH,±10%,0805,C74314
D test description,
K test key,
F ~
$ENDCMP
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$CMP 0.68uH,±10%,0805,C74315
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2.7uH,±10%,0805,C74318
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.5uH,±10%,1206,C74477
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47uH,±10%,1206,C75660
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8uH,±10%,0603,C75929
D test description,
K test key,
F ~
$ENDCMP
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$CMP 4.7uH±10%,0603,C76730
D test description,
K test key,
F ~
$ENDCMP
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$CMP 390nH±10%,0603,C76731
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10uH±10%,0603,C76732
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12uH±5%,0603,C76733
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6uH±10%,0603,C76734
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2uH±5%,0603,C76735
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uH±10%,0805,C76736
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nH±5%,0805,C76737
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120nH±10%,0805,C76738
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150nH±5%,0805,C76739
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220nH±5%,0805,C76740
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820nH±5%,0805,C76741
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uH±5%,0805,C76742
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12uH±5%,0805,C76744
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1uH±20%,0805,C76793
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5uH±20%,0805,C76794
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2uH±20%,0603,C76797
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uH±20%,0603,C76799
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15uH±10%,1812,C76823
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uH±5%,1210,C76835
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100uH±5%,1210,C76836
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5uH±5%,1210,C76837
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27uH±5%,1210,C76839
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33uH±5%,1210,C76840
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39uH±5%,1210,C76841
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uH±5%,1210,C76842
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68uH±5%,1210,C76843
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82uH±5%,1210,C76844
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2uH±5%,1210,C76845
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nH,±0.1nH,400mA,0402,C77116
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2nH,±0.1nH,0402,C77117
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5nH,±0.1nH,280mA,0402,C77118
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.8nH,±0.1nH,280mA,0402,C77119
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nH,±0.1nH,220mA,0402,C77120
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7nH,±0.1nH,220mA,0402,C77121
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3nH,±0.1nH,190mA,0402,C77122
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9nH,±0.1nH,170mA,0402,C77123
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20nH,±2%,0603,C77124
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.1nH,±0.5nH,650mA,0603,C77125
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180nH,±5%,0603,C77126
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220nH,±5%,0603,C77127
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22nH,±2%,0603,C84341
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1uH,±10%,0402,C84468
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2uH,±10%,0402,C84469
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5uH,±10%,0402,C84470
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2UH,±10%,0402,C84472
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3uH,±10%,0402,C84474
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15nH,±5%,0402,C86059
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18nH,±5%,0402,C86060
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nH,±0.3nH,900mA,0402,C86061
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33nH,±5%,0402,C86062
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39nH,±5%,0402,C86063
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3nH,±0.3nH,800mA,0402,C86064
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7nH,±0.3nH,700mA,0402,C86065
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1nH,±0.3nH,0402,C86066
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120nH,±5%,0402,C86067
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33nH,±5%,0603,C86068
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uH,±10%,1210,C86069
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uH,±20%,1210,C86070
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560uH,±5%,1210,C86071
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560uH,±10%,1210,C86072
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uH,±20%,1210,C86073
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2uH,±30%,1210,C86074
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uH,±10%,1812,C86079
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1uH,±30%,0805,C86086
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47uH,±30%,0805,C86087
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uH,±30%,0805,C86088
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2uH,±30%,0805,C86089
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uH,±20%,0805,C86090
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12nH,±2%,0402,C86128
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22nH,±2%,0402,C86129
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nH,±5%,0402,C86130
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15nH,±2%,0603,C86132
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18nH,±2%,0603,C86133
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39nH,±2%,0603,C86134
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68nH,±2%,0603,C86135
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8nH,±0.2nH,750mA,0603,C86136
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120nH,±2%,0603,C86138
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220nH,±2%,0603,C86139
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47μH,±5%,1812,C86701
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uH,±20%,0603,C86752
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22μH,±10%,1812,C86821
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uH,±10%,0603,C87216
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820nH,±10%,0402,C87452
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2uH,±20%,0603,C87511
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5uH,±5%,0603,C87514
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uH,±5%,0603,C87515
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120nH,±10%,0603,C87517
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150nH,±5%,0603,C87518
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330nH,±10%,0603,C87520
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330nH,±5%,0805,C87521
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2nH,±0.3nH,600mA,0402,C87534
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2nH,±0.3nH,0603,C87537
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56nH,±5%,0603,C87538
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2nH,±0.5nH,0402,C87541
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2nH,±5%,0402,C87542
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uH,±20%,0805,C87543
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5uH,±20%,1210,C87556
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330uH,±10%,1210,C87557
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8uH,±20%,1210,C87558
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8uH,±20%,1210,C87559
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3uH,±20%,1210,C87560
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33nH,±5%,1210,C87561
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2uH,±5%,1210,C87562
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6uH,±5%,1210,C87563
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22μH,±20%,0805,C88185
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.027uH,±5%,1210,C88514
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220μH,±5%,1210,C89015
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2μH,±5%,1210,C89016
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56μH,±5%,1210,C89022
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.15μH,±5%,1210,C89025
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.39μH,±5%,1210,C89028
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.47μH,±5%,1210,C89029
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680nH,±5%,1210,C89031
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nH,±2%,0402,C90642
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470nH,±5%,0805,C92032
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68nH,±5%,0603,C92902
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15uH,±10%,0805,C92908
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3uH,±10%,0805,C93799
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18nH,±5%,350mA,0402,C97980
D test description,
K test key,
F ~
$ENDCMP
#End Doc Library