sz_jlc_resistor.dcm

EESchema-DOCLIB  Version 2.0
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$CMP 47KΩ(473),±5%,0805,C102018
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.1Ω(1R10),±1%,0603,C103378
D test description,
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F ~
$ENDCMP
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$CMP 1.6Ω(1R60),±1%,0603,C103386
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$ENDCMP
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$CMP 3Ω(3R00),±1%,0603,C103610
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$ENDCMP
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$CMP 0.5Ω(R500),±1%,1206,C104947
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F ~
$ENDCMP
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$CMP 383Ω(3830),±1%,1206,C105607
D test description,
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$ENDCMP
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$CMP 316Ω(3160),±1%,1206,C105608
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$ENDCMP
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$CMP 316Ω(3160),±1%,0805,C105609
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$ENDCMP
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$CMP 169Ω(1690),±1%,1206,C106195
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$ENDCMP
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$CMP 86.6Ω(86R6),±1%,1206,C106196
D test description,
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$ENDCMP
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$CMP 56Ω(56R0),±1%,1812,C107596
D test description,
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$ENDCMP
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$CMP 43KΩ,(433),±5%,0805,C107618
D test description,
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$ENDCMP
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$CMP 24Ω(24R0),±1%,2512,C107659
D test description,
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$ENDCMP
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$CMP 510Ω(5100),±1%,2010,C109103
D test description,
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$ENDCMP
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$CMP 39Ω(39R0),±1%,2512,C109426
D test description,
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$ENDCMP
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$CMP 430KΩ(4303),±1%,1210,C110257
D test description,
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$ENDCMP
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$CMP 16.5Ω(16R5),±1%,1206,C110596
D test description,
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$ENDCMP
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$CMP 1Ω(1R00),±1%,2512,C11254
D test description,
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$ENDCMP
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$CMP 24Ω(24R0),±1%,1210,C113358
D test description,
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$ENDCMP
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$CMP 715Ω(7150),±1%,0402,C113474
D test description,
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$ENDCMP
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$CMP 953Ω(9530),±1%,0402,C113475
D test description,
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$ENDCMP
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$CMP 1.78KΩ(1781),±1%,0402,C113478
D test description,
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$ENDCMP
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$CMP 2.87KΩ(2871),±1%,0402,C113479
D test description,
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$ENDCMP
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$CMP 324KΩ(3243),±1%,0402,C113480
D test description,
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$ENDCMP
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$CMP 1.58KΩ(1581),±1%,0402,C113483
D test description,
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F ~
$ENDCMP
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$CMP 249KΩ(2493),±1%,0402,C11425
D test description,
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$ENDCMP
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$CMP 3.24KΩ(3241),±1%,0402,C11457
D test description,
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$ENDCMP
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$CMP 3.09KΩ(3091),±1%,0402,C11460
D test description,
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$ENDCMP
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$CMP 3.16KΩ(3161),±1%,0402,C11462
D test description,
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$ENDCMP
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$CMP 31.6KΩ(3162),±1%,0402,C11463
D test description,
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$ENDCMP
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$CMP 18.7KΩ(1872),±1%,0402,C11476
D test description,
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F ~
$ENDCMP
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$CMP 182KΩ(1823),±1%,0402,C11481
D test description,
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F ~
$ENDCMP
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$CMP 215KΩ(2153),±1%,0402,C11489
D test description,
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$ENDCMP
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$CMP 2.2MΩ(2204),±1%,0402,C11490
D test description,
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F ~
$ENDCMP
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$CMP 52.3Ω(52R3),±1%,0402,C114978
D test description,
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$ENDCMP
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$CMP 15.4Ω(15R4),±1%,0402,C114988
D test description,
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$ENDCMP
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$CMP 2MΩ(2004),±1%,0402,C11512
D test description,
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$ENDCMP
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$CMP 68.1KΩ(6812),±1%,0402,C11537
D test description,
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$ENDCMP
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$CMP 9.09KΩ(9091),±1%,0402,C11549
D test description,
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$ENDCMP
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$CMP 909Ω(9090),±1%,0402,C11550
D test description,
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$ENDCMP
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$CMP 18.7Ω(18R7),±1%,1206,C116140
D test description,
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F ~
$ENDCMP
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$CMP 510KΩ,(5103),±1%,0402,C11616
D test description,
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$ENDCMP
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$CMP 54.9KΩ(5492),±1%,0402,C11626
D test description,
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$ENDCMP
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$CMP 10.2KΩ(1022),±1%,0402,C11660
D test description,
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$ENDCMP
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$CMP 1.43KΩ(1431),±1%,0402,C11671
D test description,
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F ~
$ENDCMP
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$CMP 12.4KΩ(1242),±1%,0402,C11692
D test description,
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F ~
$ENDCMP
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$CMP 121KΩ(1213),±1%,0402,C11693
D test description,
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F ~
$ENDCMP
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$CMP 1KΩ,(1001),±1%,0402,C11702
D test description,
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$ENDCMP
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$CMP 82.5KΩ(8252),±1%,0402,C11717
D test description,
K test key,
F ~
$ENDCMP
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$CMP 22Ω(22R0),±1%,2512,C118189
D test description,
K test key,
F ~
$ENDCMP
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$CMP 16.5Ω(16R5),±1%,0603,C12054
D test description,
K test key,
F ~
$ENDCMP
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$CMP 12.7Ω(12R7),±1%,0603,C12055
D test description,
K test key,
F ~
$ENDCMP
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$CMP 11.3Ω(11R3),±1%,0603,C12056
D test description,
K test key,
F ~
$ENDCMP
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$CMP 11.5Ω(11R5),±1%,0603,C12057
D test description,
K test key,
F ~
$ENDCMP
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$CMP 120Ω(1200),±1%,1210,C122363
D test description,
K test key,
F ~
$ENDCMP
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$CMP 390Ω(3900),±1%,1210,C122364
D test description,
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F ~
$ENDCMP
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$CMP 750KΩ(7503),±1%,0402,C122545
D test description,
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F ~
$ENDCMP
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$CMP 309KΩ(3093),±1%,0402,C122546
D test description,
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F ~
$ENDCMP
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$CMP 13.3KΩ(1332),±1%,0402,C122547
D test description,
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F ~
$ENDCMP
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$CMP 33.2KΩ(3322),±1%,0402,C122548
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.54KΩ(1541),±1%,0402,C122549
D test description,
K test key,
F ~
$ENDCMP
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$CMP 510Ω(5100),±1%,1812,C124344
D test description,
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F ~
$ENDCMP
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$CMP 40.2KΩ,(4022),±1%,0603,C12447
D test description,
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F ~
$ENDCMP
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$CMP 487Ω(4870),±1%,0402,C126124
D test description,
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F ~
$ENDCMP
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$CMP 442Ω(4420),±1%,0402,C126137
D test description,
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F ~
$ENDCMP
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$CMP 22.6KΩ(2262),±1%,0805,C12825
D test description,
K test key,
F ~
$ENDCMP
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$CMP 25.5Ω(25R5),±1%,0402,C129579
D test description,
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F ~
$ENDCMP
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$CMP 90.9Ω(90R9),±1%,0402,C129693
D test description,
K test key,
F ~
$ENDCMP
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$CMP 54.9Ω(54R9),±1%,0402,C129765
D test description,
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F ~
$ENDCMP
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$CMP 17.8KΩ(1782),±1%,0402,C129766
D test description,
K test key,
F ~
$ENDCMP
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$CMP 5.11Ω(5R11),±1%,0603,C13015
D test description,
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F ~
$ENDCMP
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$CMP 8.06Ω(8R06),±1%,0603,C13049
D test description,
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F ~
$ENDCMP
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$CMP 1.8KΩ(1801),±1%,2010,C131001
D test description,
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F ~
$ENDCMP
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$CMP 2.7KΩ,(2701),±1%,0603,C13167
D test description,
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F ~
$ENDCMP
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$CMP 32.4KΩ(3242),±1%,0603,C13187
D test description,
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F ~
$ENDCMP
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$CMP 137Ω(1370),±1%,1210,C132122
D test description,
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F ~
$ENDCMP
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$CMP 560KΩ(5603),±1%,0402,C132339
D test description,
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F ~
$ENDCMP
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$CMP 1.1MΩ(1104),±1%,0402,C133039
D test description,
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F ~
$ENDCMP
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$CMP 1.1MΩ(1104),±1%,0603,C13314
D test description,
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F ~
$ENDCMP
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$CMP 1.3MΩ(1304),±1%,0603,C13316
D test description,
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F ~
$ENDCMP
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$CMP 1.8MΩ,(1804),±1%,0603,C13318
D test description,
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F ~
$ENDCMP
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$CMP 2.4MΩ(2404),±1%,0603,C13319
D test description,
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F ~
$ENDCMP
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$CMP 5.1MΩ,(5104),±1%,0603,C13320
D test description,
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F ~
$ENDCMP
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$CMP 7.5MΩ(7504),±1%,0603,C13322
D test description,
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F ~
$ENDCMP
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$CMP 8.2MΩ(8204),±1%,0603,C13323
D test description,
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F ~
$ENDCMP
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$CMP 9.1MΩ(9104),±1%,0603,C13324
D test description,
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F ~
$ENDCMP
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$CMP 120Ω(1200),±1%,2010,C133501
D test description,
K test key,
F ~
$ENDCMP
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$CMP 549KΩ(5493),±1%,1206,C134157
D test description,
K test key,
F ~
$ENDCMP
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$CMP 6.2Ω(6R20),±1%,1210,C134162
D test description,
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F ~
$ENDCMP
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$CMP 1.07Ω(1R07),±1%,1206,C136113
D test description,
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F ~
$ENDCMP
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$CMP 12.4KΩ(1242),±1%,1206,C139133
D test description,
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F ~
$ENDCMP
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$CMP 30KΩ(3002),±1%,0805,C139886
D test description,
K test key,
F ~
$ENDCMP
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$CMP 60.4Ω(60R4),±1%,0402,C144744
D test description,
K test key,
F ~
$ENDCMP
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$CMP 240Ω(2400),±1%,0402,C144776
D test description,
K test key,
F ~
$ENDCMP
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$CMP 215KΩ(2153),±1%,2010,C145018
D test description,
K test key,
F ~
$ENDCMP
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$CMP 0.22Ω(R220),±1%,2010,C146381
D test description,
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F ~
$ENDCMP
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$CMP 3.3KΩ(3301),±1%,2512,C147125
D test description,
K test key,
F ~
$ENDCMP
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$CMP 22KΩ(2202),±1%,1210,C147142
D test description,
K test key,
F ~
$ENDCMP
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$CMP 0.39Ω(R390),±1%,2512,C147837
D test description,
K test key,
F ~
$ENDCMP
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$CMP 107KΩ(1073),±1%,0603,C14889
D test description,
K test key,
F ~
$ENDCMP
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$CMP 73.2KΩ(7322),±1%,0603,C14890
D test description,
K test key,
F ~
$ENDCMP
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$CMP 64.9KΩ(6492),±1%,0603,C14891
D test description,
K test key,
F ~
$ENDCMP
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$CMP 8.45KΩ(8451),±1%,0603,C14892
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2KΩ(2001),±1%,2512,C150966
D test description,
K test key,
F ~
$ENDCMP
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$CMP 3.74KΩ(3741),±1%,0402,C15172
D test description,
K test key,
F ~
$ENDCMP
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$CMP 2.4Ω(2R40),±1%,1206,C15544
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.8Ω(1R80),±1%,1206,C15545
D test description,
K test key,
F ~
$ENDCMP
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$CMP 560KΩ,(5603),±1%,0805,C15785
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.8MΩ(185),±5%,1206,C15969
D test description,
K test key,
F ~
$ENDCMP
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$CMP 0.3Ω(R300),±1%,2512,C16074
D test description,
K test key,
F ~
$ENDCMP
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$CMP 30.9KΩ(3092),±1%,0805,C16107
D test description,
K test key,
F ~
$ENDCMP
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$CMP 3.3Ω(3R30),±1%,0805,C16257
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10KΩ(1002),±0.5%,0603,C167144
D test description,
K test key,
F ~
$ENDCMP
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$CMP 105KΩ(1053),±1%,0603,C16840
D test description,
K test key,
F ~
$ENDCMP
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$CMP 0.36Ω(0R36),±1%,2512,C168925
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10KΩ(1002),±0.5%,0805,C169071
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1KΩ(1001),±0.5%,0805,C169072
D test description,
K test key,
F ~
$ENDCMP
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$CMP 100MΩ(1006),±1%,0805,C169373
D test description,
K test key,
F ~
$ENDCMP
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$CMP 40.2Ω(40R2),±1%,0402,C170311
D test description,
K test key,
F ~
$ENDCMP
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$CMP 0Ω,(0R0),±1%,0402,C17168
D test description,
K test key,
F ~
$ENDCMP
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$CMP 365Ω(3650),±1%,1206,C172882
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.02KΩ(1021),±1%,0805,C17369
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.05KΩ(1051),±1%,0805,C17370
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.13KΩ(1131),±1%,0805,C17371
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.15KΩ(1151),±1%,0805,C17372
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.15Ω(1R15),±1%,0805,C17373
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.18KΩ(1181),±1%,0805,C17374
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.1KΩ(1101),±1%,0805,C17375
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.1Ω(1R10),±1%,0805,C17376
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.21KΩ(1211),±1%,0805,C17377
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.24KΩ(1241),±1%,0805,C17378
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.2KΩ,(1201),±1%,0805,C17379
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.2MΩ,(1204),±1%,0805,C17380
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.2Ω(1R20),±1%,0805,C17381
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.33KΩ(1331),±1%,0805,C17382
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.37KΩ(1371),±1%,0805,C17383
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.3KΩ(1301),±1%,0805,C17384
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.3Ω(1R30),±1%,0805,C17385
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.43KΩ(1431),±1%,0805,C17386
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.47KΩ(1471),±1%,0805,C17387
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.4KΩ(1401),±1%,0805,C17388
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.54KΩ(1541),±1%,0805,C17389
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.58KΩ(1581),±1%,0805,C17390
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.5Ω(1R50),±1%,0805,C17392
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.65KΩ(1651),±1%,0805,C17393
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.6KΩ(1601),±1%,0805,C17394
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.74KΩ(1741),±1%,0805,C17395
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.74Ω(1R74),±1%,0805,C17396
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.78KΩ(1781),±1%,0805,C17397
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.8KΩ,(1801),±1%,0805,C17398
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.8MΩ,(1804),±1%,0805,C17399
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.8Ω(1R80),±1%,0805,C17400
D test description,
K test key,
F ~
$ENDCMP
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$CMP 1.91KΩ(1911),±1%,0805,C17401
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10.2KΩ(1022),±1%,0805,C17402
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10.2Ω(10R2),±1%,0805,C17403
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10.5Ω(10R5),±1%,0805,C17404
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10.7KΩ(1072),±1%,0805,C17405
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10.7Ω(10R7),±1%,0805,C17406
D test description,
K test key,
F ~
$ENDCMP
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$CMP 100KΩ,(1003),±1%,0805,C17407
D test description,
K test key,
F ~
$ENDCMP
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$CMP 100Ω,(1000),±1%,0805,C17408
D test description,
K test key,
F ~
$ENDCMP
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$CMP 102Ω(1020),±1%,0805,C17409
D test description,
K test key,
F ~
$ENDCMP
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$CMP 105KΩ(1053),±1%,0805,C17410
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 105Ω(1050),±1%,0805,C17411
D test description,
K test key,
F ~
$ENDCMP
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$CMP 107KΩ(1073),±1%,0805,C17412
D test description,
K test key,
F ~
$ENDCMP
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$CMP 107Ω(1070),±1%,0805,C17413
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10KΩ,(1002),±1%,0805,C17414
D test description,
K test key,
F ~
$ENDCMP
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$CMP 10Ω,(10R0),±1%,0805,C17415
D test description,
K test key,
F ~
$ENDCMP
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$CMP 11.3KΩ(1132),±1%,0805,C17416
D test description,
K test key,
F ~
$ENDCMP
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$CMP 11.3Ω(11R3),±1%,0805,C17417
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.5KΩ(1152),±1%,0805,C17418
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.5Ω(11R5),±1%,0805,C17419
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.8KΩ(1182),±1%,0805,C17420
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.8Ω(11R8),±1%,0805,C17421
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 110KΩ,(1103),±1%,0805,C17422
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 110Ω(1100),±1%,0805,C17423
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 113KΩ(1133),±1%,0805,C17424
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 113Ω(1130),±1%,0805,C17425
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 115Ω(1150),±1%,0805,C17426
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 118KΩ(1183),±1%,0805,C17427
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 118Ω(1180),±1%,0805,C17428
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11KΩ,(1102),±1%,0805,C17429
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11Ω(11R0),±1%,0805,C17430
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.1KΩ(1212),±1%,0805,C17431
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.1Ω(12R1),±1%,0805,C17432
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.4Ω(12R4),±1%,0805,C17433
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.7KΩ(1272),±1%,0805,C17434
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.7Ω(12R7),±1%,0805,C17435
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120KΩ,(1203),±1%,0805,C17436
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120Ω,(1200),±1%,0805,C17437
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 121KΩ(1213),±1%,0805,C17438
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 121Ω(1210),±1%,0805,C17439
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 124KΩ(1243),±1%,0805,C17440
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 124Ω(1240),±1%,0805,C17441
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 127KΩ(1273),±1%,0805,C17442
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 127Ω(1270),±1%,0805,C17443
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12KΩ,(1202),±1%,0805,C17444
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12Ω(12R0),±1%,0805,C17445
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.3KΩ(1332),±1%,0805,C17446
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.3Ω(13R3),±1%,0805,C17447
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.7KΩ(1372),±1%,0805,C17448
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.7Ω(13R7),±1%,0805,C17449
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 130KΩ(1303),±1%,0805,C17450
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 130Ω(1300),±1%,0805,C17451
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 133KΩ(1333),±1%,0805,C17452
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 133Ω(1330),±1%,0805,C17453
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 137Ω(1370),±1%,0805,C17454
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13KΩ,(1302),±1%,0805,C17455
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.3KΩ(1432),±1%,0805,C17456
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.3Ω(14R3),±1%,0805,C17457
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.7KΩ(1472),±1%,0805,C17458
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.7Ω(14R7),±1%,0805,C17459
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 140KΩ(1403),±1%,0805,C17460
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 143Ω(1430),±1%,0805,C17461
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 147KΩ(1473),±1%,0805,C17462
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 147Ω(1470),±1%,0805,C17463
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14KΩ(1402),±1%,0805,C17464
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14Ω(14R0),±1%,0805,C17465
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.4KΩ(1542),±1%,0805,C17466
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.4Ω(15R4),±1%,0805,C17467
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.8KΩ(1582),±1%,0805,C17468
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.8Ω(15R8),±1%,0805,C17469
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150KΩ,(1503),±1%,0805,C17470
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150Ω,(1500),±1%,0805,C17471
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 154KΩ(1543),±1%,0805,C17472
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 154Ω(1540),±1%,0805,C17473
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 158KΩ(1583),±1%,0805,C17474
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15KΩ,(1502),±1%,0805,C17475
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.07KΩ(1071),±1%,0805,C17476
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0Ω,(0R0),±1%,0805,C17477
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.91Ω(R910),±1%,0805,C17478
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.96KΩ(1961),±1%,0805,C17479
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15Ω,(15R0),±1%,0805,C17480
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.2KΩ(1622),±1%,0805,C17481
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.2Ω(16R2),±1%,0805,C17482
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.5Ω(16R5),±1%,0805,C17483
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.9KΩ(1692),±1%,0805,C17484
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 160KΩ(1603),±1%,0805,C17485
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 162KΩ(1623),±1%,0805,C17486
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 165Ω(1650),±1%,0805,C17487
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 169KΩ(1693),±1%,0805,C17488
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 169Ω(1690),±1%,0805,C17489
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16KΩ,(1602),±1%,0805,C17490
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16Ω(16R0),±1%,0805,C17491
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.8Ω(17R8),±1%,0805,C17492
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 174KΩ(1743),±1%,0805,C17493
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 174Ω(1740),±1%,0805,C17494
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 178KΩ(1783),±1%,0805,C17495
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 178Ω(1780),±1%,0805,C17496
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18.2KΩ(1822),±1%,0805,C17497
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18.2Ω(18R2),±1%,0805,C17498
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18.7KΩ(1872),±1%,0805,C17499
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18.7Ω(18R7),±1%,0805,C17500
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180KΩ,(1803),±1%,0805,C17501
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 182KΩ(1823),±1%,0805,C17502
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 182Ω(1820),±1%,0805,C17503
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 187KΩ(1873),±1%,0805,C17504
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 187Ω(1870),±1%,0805,C17505
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18KΩ,(1802),±1%,0805,C17506
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18Ω(18R0),±1%,0805,C17507
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.1KΩ(1912),±1%,0805,C17508
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.1Ω(19R1),±1%,0805,C17509
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.6KΩ(1962),±1%,0805,C17510
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 191KΩ(1913),±1%,0805,C17511
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 196KΩ(1963),±1%,0805,C17512
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1KΩ,(1001),±1%,0805,C17513
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1MΩ,(1004),±1%,0805,C17514
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.05KΩ(2051),±1%,0805,C17515
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.15KΩ(2151),±1%,0805,C17516
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.1KΩ(2101),±1%,0805,C17517
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.21KΩ(2211),±1%,0805,C17518
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.26KΩ(2261),±1%,0805,C17519
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2KΩ,(2201),±1%,0805,C17520
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2Ω,(2R20),±1%,0805,C17521
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.32KΩ(2321),±1%,0805,C17522
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.37KΩ(2371),±1%,0805,C17523
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.43KΩ(2431),±1%,0805,C17524
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.49Ω(2R49),±1%,0805,C17525
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4KΩ,(2401),±1%,0805,C17526
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4MΩ(2404),±1%,0805,C17527
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4Ω(2R40),±1%,0805,C17528
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.61KΩ(2611),±1%,0805,C17529
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7KΩ,(2701),±1%,0805,C17530
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7MΩ(2704),±1%,0805,C17531
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7Ω(2R70),±1%,0805,C17532
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.87KΩ(2871),±1%,0805,C17533
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.8KΩ(2801),±1%,0805,C17534
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.8Ω(2R80),±1%,0805,C17535
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.94KΩ(2941),±1%,0805,C17536
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20.5KΩ(2052),±1%,0805,C17537
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20.5Ω(20R5),±1%,0805,C17538
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300KΩ(3003),±1%,2512,C175383
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200KΩ,(2003),±1%,0805,C17539
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200Ω,(2000),±1%,0805,C17540
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 205KΩ(2053),±1%,0805,C17541
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 205Ω(2050),±1%,0805,C17542
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20Ω,(20R0),±1%,0805,C17544
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 21.5KΩ(2152),±1%,0805,C17545
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 21.5Ω(21R5),±1%,0805,C17546
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 210KΩ(2103),±1%,0805,C17547
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 210Ω(2100),±1%,0805,C17548
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 215Ω(2150),±1%,0805,C17549
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 21KΩ(2102),±1%,0805,C17550
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 21Ω(21R0),±1%,0805,C17551
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.1KΩ(2212),±1%,0805,C17552
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.1Ω(22R1),±1%,0805,C17553
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.6Ω(22R6),±1%,0805,C17555
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220KΩ,(2203),±1%,0805,C17556
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220Ω,(2200),±1%,0805,C17557
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 221Ω(2210),±1%,0805,C17558
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 226Ω(2260),±1%,0805,C17559
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22KΩ,(2202),±1%,0805,C17560
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22Ω,(22R0),±1%,0805,C17561
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.2KΩ(2322),±1%,0805,C17562
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.2Ω(23R2),±1%,0805,C17563
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.7KΩ(2372),±1%,0805,C17564
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.7Ω(23R7),±1%,0805,C17565
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 232KΩ(2323),±1%,0805,C17566
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 232Ω(2320),±1%,0805,C17567
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 237KΩ(2373),±1%,0805,C17568
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.3KΩ(2432),±1%,0805,C17569
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.3Ω(24R3),±1%,0805,C17570
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.9KΩ(2492),±1%,0805,C17571
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 240Ω,(2400),±1%,0805,C17572
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 243KΩ(2433),±1%,0805,C17573
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 249Ω(2490),±1%,0805,C17574
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24KΩ,(2402),±1%,0805,C17575
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24Ω(24R0),±1%,0805,C17576
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 25.5Ω(25R5),±1%,0805,C17577
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 255KΩ(2553),±1%,0805,C17578
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 255Ω(2550),±1%,0805,C17579
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.1Ω(26R1),±1%,0805,C17580
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.7KΩ(2672),±1%,0805,C17581
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.7Ω(26R7),±1%,0805,C17582
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 261KΩ(2613),±1%,0805,C17583
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 261Ω(2610),±1%,0805,C17584
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 267KΩ(2673),±1%,0805,C17585
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 267Ω(2670),±1%,0805,C17586
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27.4KΩ(2742),±1%,0805,C17587
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27.4Ω(27R4),±1%,0805,C17588
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270KΩ,(2703),±1%,0805,C17589
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270Ω,(2700),±1%,0805,C17590
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 274KΩ(2743),±1%,0805,C17591
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 274Ω(2740),±1%,0805,C17592
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27KΩ,(2702),±1%,0805,C17593
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27Ω,(27R0),±1%,0805,C17594
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28.7KΩ(2872),±1%,0805,C17595
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28.7Ω(28R7),±1%,0805,C17596
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 280KΩ(2803),±1%,0805,C17597
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 287KΩ(2873),±1%,0805,C17598
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 287Ω(2870),±1%,0805,C17599
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28KΩ(2802),±1%,0805,C17600
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28Ω(28R0),±1%,0805,C17601
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 29.4KΩ(2942),±1%,0805,C17602
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 29.4Ω(29R4),±1%,0805,C17603
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2KΩ,(2001),±1%,0805,C17604
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 294KΩ(2943),±1%,0805,C17605
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2Ω,(2R00),±1%,0805,C17606
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.09KΩ(3091),±1%,0805,C17607
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.4KΩ(3401),±1%,0805,C17608
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.24KΩ(3241),±1%,0805,C17609
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6Ω(3R60),±1%,0805,C17610
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.65KΩ(3651),±1%,0805,C17611
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.57KΩ(3571),±1%,0805,C17613
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9KΩ,(3901),±1%,0805,C17614
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9Ω(3R90),±1%,0805,C17615
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300KΩ,(3003),±1%,0805,C17616
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300Ω,(3000),±1%,0805,C17617
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 301Ω(3010),±1%,0805,C17618
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 301KΩ(3013),±1%,0805,C17619
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 309Ω(3090),±1%,0805,C17620
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30KΩ(3002),±1%,0805,C17621
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30Ω(30R0),±1%,0805,C17622
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 31.6KΩ(3162),±1%,0805,C17623
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 31.6Ω(31R6),±1%,0805,C17624
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 32.4Ω(32R4),±1%,0805,C17625
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 324KΩ(3243),±1%,0805,C17626
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 324Ω(3240),±1%,0805,C17627
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33.2Ω(33R2),±1%,0805,C17628
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330KΩ,(3303),±1%,0805,C17629
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330Ω,(3300),±1%,0805,C17630
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 332KΩ(3323),±1%,0805,C17631
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 332Ω(3320),±1%,0805,C17632
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33KΩ,(3302),±1%,0805,C17633
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33Ω,(33R0),±1%,0805,C17634
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34.8Ω(34R8),±1%,0805,C17635
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 340KΩ(3403),±1%,0805,C17636
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 340Ω(3400),±1%,0805,C17637
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 348KΩ(3483),±1%,0805,C17638
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 348Ω(3480),±1%,0805,C17639
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34KΩ(3402),±1%,0805,C17640
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34Ω(34R0),±1%,0805,C17641
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 35.7Ω(35R7),±1%,0805,C17642
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 357KΩ(3573),±1%,0805,C17643
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36.5Ω(36R5),±1%,0805,C17644
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 360KΩ(3603),±1%,0805,C17645
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 360Ω(3600),±1%,0805,C17646
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 365KΩ(3653),±1%,0805,C17647
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 374KΩ(3743),±1%,0805,C17649
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 38.3KΩ(3832),±1%,0805,C17650
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 38.3Ω(38R3),±1%,0805,C17651
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 383KΩ(3833),±1%,0805,C17652
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 383Ω(3830),±1%,0805,C17653
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39.2Ω(39R2),±1%,0805,C17654
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390Ω,(3900),±1%,0805,C17655
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390KΩ,(3903),±1%,0805,C17656
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 392KΩ(3923),±1%,0805,C17657
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 392Ω(3920),±1%,0805,C17658
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39Ω(39R0),±1%,0805,C17659
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3Ω(3R00),±1%,0805,C17660
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3KΩ,(3001),±1%,0805,C17661
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3MΩ(3004),±1%,0805,C17662
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.02KΩ(4021),±1%,0805,C17663
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.12KΩ(4121),±1%,0805,C17664
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.22KΩ(4221),±1%,0805,C17665
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.32KΩ(4321),±1%,0805,C17666
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3KΩ,(4301),±1%,0805,C17667
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3MΩ(4304),±1%,0805,C17668
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3Ω(4R30),±1%,0805,C17669
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.53KΩ(4531),±1%,0805,C17670
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.64KΩ(4641),±1%,0805,C17671
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.75KΩ(4751),±1%,0805,C17672
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7KΩ,(4701),±1%,0805,C17673
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7MΩ,(4704),±1%,0805,C17674
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7Ω,(4R70),±1%,0805,C17675
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.87KΩ(4871),±1%,0805,C17676
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.99KΩ,(4991),±1%,0805,C17677
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 40.2KΩ,(4022),±1%,0805,C17678
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 40.2Ω(40R2),±1%,0805,C17679
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 402KΩ(4023),±1%,0805,C17680
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 402Ω(4020),±1%,0805,C17681
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 41.2KΩ(4122),±1%,0805,C17682
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 41.2Ω(41R2),±1%,0805,C17683
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 412KΩ(4123),±1%,0805,C17684
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 412Ω(4120),±1%,0805,C17685
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 42.2KΩ(4222),±1%,0805,C17686
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 42.2Ω(42R2),±1%,0805,C17687
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 422KΩ(4223),±1%,0805,C17688
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 422Ω(4220),±1%,0805,C17689
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43.2KΩ(4322),±1%,0805,C17690
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43.2Ω(43R2),±1%,0805,C17691
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 430KΩ(4303),±1%,0805,C17692
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 432KΩ(4323),±1%,0805,C17693
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 432Ω(4320),±1%,0805,C17694
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43KΩ,(4302),±1%,0805,C17695
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 44.2KΩ(4422),±1%,0805,C17697
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 44.2Ω(44R2),±1%,0805,C17698
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 442KΩ(4423),±1%,0805,C17699
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 442Ω(4420),±1%,0805,C17700
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 45.3KΩ(4532),±1%,0805,C17701
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 453KΩ(4533),±1%,0805,C17702
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 453Ω(4530),±1%,0805,C17703
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 46.4KΩ(4642),±1%,0805,C17704
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 46.4Ω(46R4),±1%,0805,C17705
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 464KΩ(4643),±1%,0805,C17706
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 464Ω(4640),±1%,0805,C17707
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47.5Ω(47R5),±1%,0805,C17708
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470KΩ,(4703),±1%,0805,C17709
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470Ω,(4700),±1%,0805,C17710
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 475KΩ(4753),±1%,0805,C17711
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 475Ω(4750),±1%,0805,C17712
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47KΩ,(4702),±1%,0805,C17713
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47Ω,(47R0),±1%,0805,C17714
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 48.7KΩ(4872),±1%,0805,C17715
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 48.7Ω(48R7),±1%,0805,C17716
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 487KΩ(4873),±1%,0805,C17717
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 487Ω(4870),±1%,0805,C17718
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 49.9KΩ,(4992),±1%,0805,C17719
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 49.9Ω,(49R9),±1%,0805,C17720
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 499KΩ(4993),±1%,0805,C17721
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 499Ω(4990),±1%,0805,C17722
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1Ω,(5R10),±1%,0805,C17724
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.36KΩ(5361),±1%,0805,C17725
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.49KΩ(5491),±1%,0805,C17726
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6MΩ(5604),±1%,0805,C17728
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6Ω(5R60),±1%,0805,C17729
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.9KΩ(5901),±1%,0805,C17730
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51.1KΩ(5112),±1%,0805,C17731
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51.1Ω(51R1),±1%,0805,C17732
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 510KΩ,(5103),±1%,0805,C17733
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 510Ω,(5100),±1%,0805,C17734
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 511KΩ(5113),±1%,0805,C17735
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 511Ω(5110),±1%,0805,C17736
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51KΩ,(5102),±1%,0805,C17737
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51Ω,(51R0),±1%,0805,C17738
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.23KΩ(5231),±1%,0805,C17739
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 52.3KΩ(5232),±1%,0805,C17740
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 52.3Ω(52R3),±1%,0805,C17741
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 523KΩ(5233),±1%,0805,C17742
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 523Ω(5230),±1%,0805,C17743
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 53.6Ω(53R6),±1%,0805,C17744
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 536KΩ(5363),±1%,0805,C17745
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 536Ω(5360),±1%,0805,C17746
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 54.9KΩ(5492),±1%,0805,C17747
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 54.9Ω(54R9),±1%,0805,C17748
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 549KΩ(5493),±1%,0805,C17749
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 549Ω(5490),±1%,0805,C17750
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56.2KΩ(5622),±1%,0805,C17751
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56.2Ω(56R2),±1%,0805,C17752
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 562KΩ(5623),±1%,0805,C17754
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 562Ω(5620),±1%,0805,C17755
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56KΩ,(5602),±1%,0805,C17756
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56Ω,(56R0),±1%,0805,C17757
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 57.6KΩ(5762),±1%,0805,C17758
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 57.6Ω(57R6),±1%,0805,C17759
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 576KΩ(5763),±1%,0805,C17760
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 576Ω(5760),±1%,0805,C17761
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 590KΩ(5903),±1%,0805,C17762
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 59KΩ(5902),±1%,0805,C17763
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.04KΩ(6041),±1%,0805,C17765
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.19KΩ(6191),±1%,0805,C17766
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2KΩ,(6201),±1%,0805,C17767
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2Ω(6R20),±1%,0805,C17768
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.49KΩ(6491),±1%,0805,C17769
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.65KΩ(6651),±1%,0805,C17770
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.81KΩ(6811),±1%,0805,C17771
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8KΩ,(6801),±1%,0805,C17772
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8MΩ(6804),±1%,0805,C17773
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8Ω(6R80),±1%,0805,C17774
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.98KΩ(6981),±1%,0805,C17775
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 604KΩ(6043),±1%,0805,C17776
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 604Ω(6040),±1%,0805,C17777
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 61.9KΩ(6192),±1%,0805,C17778
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 61.9Ω(61R9),±1%,0805,C17779
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 619KΩ(6193),±1%,0805,C17780
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 619Ω(6190),±1%,0805,C17781
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 620Ω(6200),±1%,0805,C17782
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62KΩ,(6202),±1%,0805,C17783
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62Ω(62R0),±1%,0805,C17784
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 63.4KΩ(6342),±1%,0805,C17785
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 63.4Ω(63R4),±1%,0805,C17786
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 634Ω(6340),±1%,0805,C17787
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 64.9KΩ(6492),±1%,0805,C17788
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 64.9Ω(64R9),±1%,0805,C17789
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 649KΩ(6493),±1%,0805,C17790
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 66.5KΩ(6652),±1%,0805,C17791
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 66.5Ω(66R5),±1%,0805,C17792
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 665KΩ(6653),±1%,0805,C17793
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 665Ω(6650),±1%,0805,C17794
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68.1KΩ(6812),±1%,0805,C17795
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68.1Ω(68R1),±1%,0805,C17796
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680KΩ,(6803),±1%,0805,C17797
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680Ω,(6800),±1%,0805,C17798
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 681KΩ(6813),±1%,0805,C17799
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 681Ω(6810),±1%,0805,C17800
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68KΩ,(6802),±1%,0805,C17801
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68Ω,(68R0),±1%,0805,C17802
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 69.8KΩ(6982),±1%,0805,C17803
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 69.8Ω(69R8),±1%,0805,C17804
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 698KΩ(6983),±1%,0805,C17805
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.15KΩ(7151),±1%,0805,C17806
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5KΩ,(7501),±1%,0805,C17807
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5MΩ(7504),±1%,0805,C17808
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5Ω(7R50),±1%,0805,C17809
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.87KΩ(7871),±1%,0805,C17810
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 71.5KΩ(7152),±1%,0805,C17811
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 71.5Ω(71R5),±1%,0805,C17812
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 715Ω(7150),±1%,0805,C17813
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 73.2KΩ(7322),±1%,0805,C17814
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 73.2Ω(73R2),±1%,0805,C17815
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 732KΩ(7323),±1%,0805,C17816
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 750KΩ(7503),±1%,0805,C17817
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 750Ω,(7500),±1%,0805,C17818
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 75KΩ,(7502),±1%,0805,C17819
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 76.8KΩ(7682),±1%,0805,C17821
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 768KΩ(7683),±1%,0805,C17822
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 768Ω(7680),±1%,0805,C17823
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 78.7Ω(78R7),±1%,0805,C17824
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 787KΩ(7873),±1%,0805,C17825
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 787Ω(7870),±1%,0805,C17826
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.25KΩ(8251),±1%,0805,C17827
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2KΩ,(8201),±1%,0805,C17828
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2MΩ(8204),±1%,0805,C17829
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2Ω(8R20),±1%,0805,C17830
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.45KΩ(8451),±1%,0805,C17831
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.66KΩ(8661),±1%,0805,C17832
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 80.6Ω(80R6),±1%,0805,C17833
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 806Ω(8060),±1%,0805,C17834
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82.5KΩ(8252),±1%,0805,C17835
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82.5Ω(82R5),±1%,0805,C17836
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820Ω,(8200),±1%,0805,C17837
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 825KΩ(8253),±1%,0805,C17838
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 825Ω(8250),±1%,0805,C17839
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82KΩ,(8202),±1%,0805,C17840
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82Ω,(82R0),±1%,0805,C17841
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 84.5KΩ(8452),±1%,0805,C17842
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 84.5Ω(84R5),±1%,0805,C17843
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 845KΩ(8453),±1%,0805,C17844
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 845Ω(8450),±1%,0805,C17845
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 86.6KΩ(8662),±1%,0805,C17846
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 86.6Ω(86R6),±1%,0805,C17847
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 866KΩ(8663),±1%,0805,C17848
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 866Ω(8660),±1%,0805,C17849
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 88.7KΩ(8872),±1%,0805,C17850
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 88.7Ω(88R7),±1%,0805,C17851
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 887KΩ(8873),±1%,0805,C17852
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 887Ω(8870),±1%,0805,C17853
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.09KΩ(9091),±1%,0805,C17854
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.1KΩ,(9101),±1%,0805,C17855
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.1MΩ(9104),±1%,0805,C17856
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.1Ω(9R10),±1%,0805,C17857
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.53KΩ(9531),±1%,0805,C17858
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.76KΩ(9761),±1%,0805,C17859
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 90.9KΩ(9092),±1%,0805,C17860
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 90.9Ω(90R9),±1%,0805,C17861
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 909KΩ(9093),±1%,0805,C17862
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 909Ω(9090),±1%,0805,C17863
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 910KΩ(9103),±1%,0805,C17864
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 910Ω(9100),±1%,0805,C17865
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 91KΩ,(9102),±1%,0805,C17866
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 93.1KΩ(9312),±1%,0805,C17869
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 93.1Ω(93R1),±1%,0805,C17870
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 931KΩ(9313),±1%,0805,C17871
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 931Ω(9310),±1%,0805,C17872
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 95.3KΩ(9532),±1%,0805,C17873
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 95.3Ω(95R3),±1%,0805,C17874
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 953KΩ(9533),±1%,0805,C17875
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 953Ω(9530),±1%,0805,C17876
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 97.6KΩ(9762),±1%,0805,C17877
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 97.6Ω(97R6),±1%,0805,C17878
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 976KΩ(9763),±1%,0805,C17879
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 976Ω(9760),±1%,0805,C17880
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.74Ω(3R74),±1%,1206,C17881
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6KΩ(3601),±1%,1206,C17882
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9KΩ(3901),±1%,1206,C17883
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300KΩ(3003),±1%,1206,C17884
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9Ω(3R90),±1%,1206,C17885
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30Ω(30R0),±1%,1206,C17886
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300Ω,(3000),±1%,1206,C17887
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0Ω,(0R0),±1%,1206,C17888
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.1KΩ(1101),±1%,1206,C17889
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.1Ω(1R10),±1%,1206,C17890
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2KΩ(1201),±1%,1206,C17891
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.3KΩ(1301),±1%,1206,C17892
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.3Ω(1R30),±1%,1206,C17893
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2Ω(1R20),±1%,1206,C17894
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.37KΩ(1371),±1%,1206,C17895
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6KΩ(1601),±1%,1206,C17896
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6Ω(1R60),±1%,1206,C17897
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5MΩ(1504),±1%,1206,C17898
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5Ω(1R50),±1%,1206,C17899
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100KΩ,(1003),±1%,1206,C17900
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100Ω,(1000),±1%,1206,C17901
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10KΩ,(1002),±1%,1206,C17902
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10Ω,(10R0),±1%,1206,C17903
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 110KΩ(1103),±1%,1206,C17904
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 110Ω(1100),±1%,1206,C17905
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11KΩ(1102),±1%,1206,C17906
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11Ω(11R0),±1%,1206,C17907
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120KΩ(1203),±1%,1206,C17908
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120Ω(1200),±1%,1206,C17909
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 121KΩ(1213),±1%,1206,C17910
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13Ω(13R0),±1%,1206,C17911
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12KΩ(1202),±1%,1206,C17912
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12Ω(12R0),±1%,1206,C17913
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 130Ω(1300),±1%,1206,C17914
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14KΩ(1402),±1%,1206,C17915
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150KΩ(1503),±1%,1206,C17916
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150Ω(1500),±1%,1206,C17917
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15Ω(15R0),±1%,1206,C17918
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 160Ω(1600),±1%,1206,C17919
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16Ω(16R0),±1%,1206,C17920
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18KΩ(1802),±1%,1206,C17921
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18Ω(18R0),±1%,1206,C17922
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180KΩ(1803),±1%,1206,C17923
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180Ω,(1800),±1%,1206,C17924
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 182KΩ(1823),±1%,1206,C17925
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1MΩ(1004),±1%,1206,C17927
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1Ω,(1R00),±1%,1206,C17928
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330KΩ(3303),±1%,1206,C17929
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330Ω(3300),±1%,1206,C17930
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 360KΩ(3603),±1%,1206,C17931
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 360Ω(3600),±1%,1206,C17932
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390KΩ(3903),±1%,1206,C17933
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.75KΩ(4751),±1%,1206,C17935
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7KΩ,(4701),±1%,1206,C17936
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7Ω(4R70),±1%,1206,C17937
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3Ω(3R00),±1%,1206,C17939
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270KΩ(2703),±1%,1206,C17940
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270Ω(2700),±1%,1206,C17941
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2Ω(2R00),±1%,1206,C17942
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27KΩ(2702),±1%,1206,C17943
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2KΩ,(2001),±1%,1206,C17944
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3Ω(3R30),±1%,1206,C17945
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27Ω(27R0),±1%,1206,C17946
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2Ω(2R20),±1%,1206,C17947
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2KΩ(2201),±1%,1206,C17948
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4KΩ(2401),±1%,1206,C17949
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7KΩ(2701),±1%,1206,C17950
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7MΩ(2704),±1%,1206,C17951
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7Ω(2R70),±1%,1206,C17952
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 21KΩ(2102),±1%,1206,C17953
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200KΩ(2003),±1%,1206,C17954
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20Ω,(20R0),±1%,1206,C17955
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220KΩ(2203),±1%,1206,C17956
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220Ω(2200),±1%,1206,C17957
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22Ω,(22R0),±1%,1206,C17958
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 249Ω(2490),±1%,1206,C17959
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24KΩ(2402),±1%,1206,C17960
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 240Ω(2400),±1%,1206,C17961
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.9Ω(24R9),±1%,1206,C17962
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24Ω(24R0),±1%,1206,C17963
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 430KΩ(4303),±1%,1206,C17964
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 430Ω(4300),±1%,1206,C17965
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43.2KΩ(4322),±1%,1206,C17966
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 46.4Ω(46R4),±1%,1206,C17967
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.11KΩ(5111),±1%,1206,C17968
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47Ω(47R0),±1%,1206,C17969
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6Ω(5R60),±1%,1206,C17970
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62Ω(62R0),±1%,1206,C17971
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 620KΩ(6203),±1%,1206,C17972
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 620Ω(6200),±1%,1206,C17973
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680KΩ(6803),±1%,1206,C17974
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680Ω(6800),±1%,1206,C17975
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68Ω(68R0),±1%,1206,C17976
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5Ω(7R50),±1%,1206,C17977
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5KΩ(7501),±1%,1206,C17978
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82KΩ(8202),±1%,1206,C17979
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82Ω(82R0),±1%,1206,C17980
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 91KΩ(9102),±1%,1206,C17981
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 866Ω(8660),±1%,1206,C17982
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820KΩ(8203),±1%,1206,C17983
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820Ω(8200),±1%,1206,C17984
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 750Ω,(7500),±1%,1206,C17985
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 75KΩ(7502),±1%,1206,C17986
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 75Ω(75R0),±1%,1206,C17987
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.9Ω(5R90),±1%,1206,C17988
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51.1Ω(51R1),±1%,1206,C17989
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 510KΩ(5103),±1%,1206,C17990
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 510Ω(5100),±1%,1206,C17991
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51KΩ(5102),±1%,1206,C17992
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560KΩ(5603),±1%,1206,C17993
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560Ω(5600),±1%,1206,C17994
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56Ω(56R0),±1%,1206,C17995
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2KΩ(6201),±1%,1206,C17996
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470KΩ(4703),±1%,1206,C17997
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6Ω(3R60),±1%,1206,C17998
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30KΩ(3002),±1%,1206,C17999
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.9KΩ(2492),±1%,1206,C18000
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 240KΩ(2403),±1%,1206,C18001
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200Ω(2000),±1%,1206,C18002
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20KΩ(2002),±1%,1206,C18003
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33KΩ(3302),±1%,1206,C18004
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33Ω(33R0),±1%,1206,C18005
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36Ω(36R0),±1%,1206,C18006
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36KΩ(3602),±1%,1206,C18007
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39KΩ(3902),±1%,1206,C18008
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3KΩ(4301),±1%,1206,C18009
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3Ω(4R30),±1%,1206,C18010
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3KΩ(3001),±1%,1206,C18012
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43KΩ(4302),±1%,1206,C18013
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43Ω(43R0),±1%,1206,C18014
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 499Ω(4990),±1%,1206,C18016
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 49.9KΩ(4992),±1%,1206,C18017
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 49.9Ω(49R9),±1%,1206,C18018
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51Ω(51R0),±1%,1206,C18019
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1Ω(5R10),±1%,1206,C18020
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62KΩ(6202),±1%,1206,C18021
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2Ω(8R20),±1%,1206,C18022
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 910KΩ(9103),±1%,1206,C18023
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 910Ω(9100),±1%,1206,C18024
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.1KΩ(9101),±1%,1206,C18025
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.1Ω(9R10),±1%,1206,C18026
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2KΩ(8201),±1%,1206,C18027
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6KΩ(5601),±1%,1206,C18028
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56KΩ(5602),±1%,1206,C18029
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 280Ω(2800),±1%,1206,C18178
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.24Ω(3R24),±1%,0603,C181897
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12KΩ(1202),±1%,1210,C182355
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2KΩ(6201),±1%,1210,C182356
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6KΩ,(3601),±1%,0805,C18359
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.92KΩ(3921),±1%,0805,C18360
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.76KΩ(5761),±1%,0805,C18361
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.9Ω(16R9),±1%,0805,C189656
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.4Ω(17R4),±1%,0805,C189657
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 76.8Ω(76R8),±1%,0805,C189660
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.21MΩ(1214),±1%,0805,C189661
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.13MΩ(1134),±1%,0805,C189663
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.37MΩ(1374),±1%,0805,C189664
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.43MΩ(1434),±1%,0805,C189665
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.47MΩ(1474),±1%,0805,C189666
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.62MΩ(1624),±1%,0805,C189667
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.91MΩ(1914),±1%,0805,C189669
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.26MΩ(2264),±1%,0805,C189670
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.43MΩ(2434),±1%,0805,C189671
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.87MΩ(2874),±1%,0805,C189672
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.06KΩ(8061),±1%,0805,C19006
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36Ω(36R),±1%,2512,C190228
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.75Ω(R750),±1%,1206,C19107
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.68Ω(R680),±1%,1206,C19108
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.21KΩ(1211),±1%,2010,C191220
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5KΩ(1501),±1%,25PPM,0603,C192807
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39KΩ(3902),±1%,25PPM,0603,C192809
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 86.6KΩ(8662),±1%,0402,C19709
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.4KΩ(1742),±1%,0805,C19796
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.34KΩ(6341),±1%,0805,C19797
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15Ω(15R0),±1%,2512,C20087
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5KΩ(152),±5%,2010,C20374
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2MΩ,(225),±5%,2010,C20400
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300Ω,(301),±5%,2010,C20406
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33Ω,(330),±5%,2010,C20411
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47KΩ,(473),±5%,2010,C20428
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7KΩ(472),±5%,2010,C20431
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51KΩ,(513),±5%,2010,C20435
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6KΩ(562),±5%,2010,C20441
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 750Ω(751),±5%,2010,C20456
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2Ω,(8R2),±5%,2010,C20466
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 75Ω,(75R0),±1%,0805,C20638
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.22Ω(R220),±1%,0603,C20686
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.47Ω(R470),±1%,2512,C21097
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0Ω,(0R0),±1%,0603,C21189
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1KΩ,(1001),±1%,0603,C21190
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.49KΩ(2491),±1%,0805,C21237
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.5Ω(R500),±1%,1210,C21355
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2Ω,(1R20),±1%,0603,C21389
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 53.6KΩ(5362),±1%,0805,C21398
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.62KΩ(5621),±1%,0805,C21437
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2Ω(1R20),±1%,1812,C21617
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1KΩ(1001),±1%,1812,C21618
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2KΩ(2001),±1%,1812,C21619
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3Ω(3R30),±1%,1210,C21624
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 287KΩ(2873),±1%,1206,C21635
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.1KΩ(3012),±1%,0805,C21841
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.48KΩ(3481),±1%,0402,C22065
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2MΩ,(1204),±1%,1206,C22107
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.8KΩ(1801),±1%,1206,C22108
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39Ω(39R0),±1%,1206,C22198
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5MΩ(1504),±1%,0402,C22276
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.51Ω(R510),±1%,1210,C22519
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2MΩ(205),±5%,1206,C22581
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.07KΩ(1071),±1%,0603,C22762
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.18KΩ(1181),±1%,0603,C22763
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.1KΩ,(1101),±1%,0603,C22764
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2KΩ,(1201),±1%,0603,C22765
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2MΩ,(1204),±1%,0603,C22766
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.3KΩ(1301),±1%,0603,C22767
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.58KΩ(1581),±1%,0603,C22768
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5Ω,(1R50),±1%,0603,C22769
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6MΩ(1604),±1%,0603,C22770
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.8Ω,(1R80),±1%,0603,C22771
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.2KΩ(1022),±1%,0603,C22772
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.2Ω(10R2),±1%,0603,C22773
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.7Ω(10R7),±1%,0603,C22774
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100Ω,(1000),±1%,0603,C22775
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 102Ω(1020),±1%,0603,C22776
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 105Ω(1050),±1%,0603,C22777
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 107Ω(1070),±1%,0603,C22778
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.8Ω(11R8),±1%,0603,C22780
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 110Ω,(1100),±1%,0603,C22781
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 113Ω(1130),±1%,0603,C22782
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 115KΩ(1153),±1%,0603,C22783
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 118Ω(1180),±1%,0603,C22784
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.1Ω(12R1),±1%,0603,C22785
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.4Ω(12R4),±1%,0603,C22786
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120Ω,(1200),±1%,0603,C22787
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 124KΩ(1243),±1%,0603,C22788
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 127Ω(1270),±1%,0603,C22789
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12KΩ,(1202),±1%,0603,C22790
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12Ω,(12R0),±1%,0603,C22791
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.3Ω(13R3),±1%,0603,C22792
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.7KΩ(1372),±1%,0603,C22793
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.7Ω(13R7),±1%,0603,C22794
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 130KΩ,(1303),±1%,0603,C22795
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 130Ω,(1300),±1%,0603,C22796
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13KΩ,(1302),±1%,0603,C22797
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13Ω(13R0),±1%,0603,C22798
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.3KΩ(1432),±1%,0603,C22799
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.3Ω(14R3),±1%,0603,C22800
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.7Ω(14R7),±1%,0603,C22801
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 143Ω(1430),±1%,0603,C22802
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14KΩ(1402),±1%,0603,C22803
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.4KΩ(1542),±1%,0603,C22804
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.4Ω(15R4),±1%,0603,C22805
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.8Ω(15R8),±1%,0603,C22806
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150KΩ,(1503),±1%,0603,C22807
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150Ω,(1500),±1%,0603,C22808
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15KΩ,(1502),±1%,0603,C22809
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15Ω,(15R0),±1%,0603,C22810
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.2Ω(16R2),±1%,0603,C22811
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.5KΩ(1652),±1%,0603,C22812
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 160KΩ,(1603),±1%,0603,C22813
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 160Ω,(1600),±1%,0603,C22814
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 162KΩ(1623),±1%,0603,C22815
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 165KΩ(1653),±1%,0603,C22816
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 169KΩ(1693),±1%,0603,C22817
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16KΩ,(1602),±1%,0603,C22818
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.4KΩ(1742),±1%,0603,C22819
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.4Ω(17R4),±1%,0603,C22820
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.8KΩ(1782),±1%,0603,C22821
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.8Ω(17R8),±1%,0603,C22822
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 178KΩ(1783),±1%,0603,C22823
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 178Ω(1780),±1%,0603,C22824
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18.2Ω(18R2),±1%,0603,C22825
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18.7Ω(18R7),±1%,0603,C22826
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180KΩ,(1803),±1%,0603,C22827
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180Ω,(1800),±1%,0603,C22828
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 187Ω(1870),±1%,0603,C22829
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18Ω,(18R0),±1%,0603,C22830
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.02KΩ(1021),±1%,0603,C22831
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.05KΩ(1051),±1%,0603,C22832
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.13KΩ(1131),±1%,0603,C22833
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.15KΩ(1151),±1%,0603,C22834
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.21KΩ(1211),±1%,0603,C22835
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.27KΩ(1271),±1%,0603,C22836
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.33KΩ(1331),±1%,0603,C22838
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.37KΩ(1371),±1%,0603,C22839
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.43KΩ(1431),±1%,0603,C22840
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.47KΩ(1471),±1%,0603,C22841
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.54KΩ(1541),±1%,0603,C22842
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5KΩ,(1501),±1%,0603,C22843
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.62KΩ(1621),±1%,0603,C22844
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.65KΩ(1651),±1%,0603,C22845
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.69KΩ(1691),±1%,0603,C22846
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6KΩ(1601),±1%,0603,C22847
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.74KΩ(1741),±1%,0603,C22848
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.78KΩ(1781),±1%,0603,C22849
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.87KΩ(1871),±1%,0603,C22850
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.91KΩ(1911),±1%,0603,C22853
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.96KΩ(1961),±1%,0603,C22854
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.5KΩ(1052),±1%,0603,C22855
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.5Ω(10R5),±1%,0603,C22856
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.7KΩ(1072),±1%,0603,C22857
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 102KΩ(1023),±1%,0603,C22858
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10Ω,(10R0),±1%,0603,C22859
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.3KΩ(1132),±1%,0603,C22860
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.8KΩ(1182),±1%,0603,C22861
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 113KΩ(1133),±1%,0603,C22862
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 115Ω(1150),±1%,0603,C22863
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.1KΩ(1212),±1%,0603,C22864
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.4KΩ(1242),±1%,0603,C22865
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.7KΩ(1272),±1%,0603,C22866
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 121Ω(1210),±1%,0603,C22867
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 124Ω(1240),±1%,0603,C22868
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 127KΩ(1273),±1%,0603,C22869
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 133KΩ(1333),±1%,0603,C22870
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 133Ω(1330),±1%,0603,C22871
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 137KΩ(1373),±1%,0603,C22872
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 137Ω(1370),±1%,0603,C22873
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.7KΩ(1472),±1%,0603,C22874
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 140KΩ(1403),±1%,0603,C22875
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 140Ω(1400),±1%,0603,C22876
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 143KΩ(1433),±1%,0603,C22877
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 147KΩ(1473),±1%,0603,C22878
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 147Ω(1470),±1%,0603,C22879
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.8KΩ(1582),±1%,0603,C22880
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 154KΩ(1543),±1%,0603,C22881
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 154Ω(1540),±1%,0603,C22882
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 158KΩ(1583),±1%,0603,C22883
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 158Ω(1580),±1%,0603,C22884
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.2KΩ(1622),±1%,0603,C22885
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.9Ω(16R9),±1%,0603,C22886
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 162Ω(1620),±1%,0603,C22887
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 165Ω(1650),±1%,0603,C22888
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 169Ω(1690),±1%,0603,C22889
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 174KΩ(1743),±1%,0603,C22890
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 174Ω(1740),±1%,0603,C22891
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18.2KΩ(1822),±1%,0603,C22892
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18.7KΩ(1872),±1%,0603,C22893
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 182KΩ(1823),±1%,0603,C22894
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 182Ω(1820),±1%,0603,C22895
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 187KΩ(1873),±1%,0603,C22896
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.1KΩ(1912),±1%,0603,C22897
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.6KΩ(1962),±1%,0603,C22898
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 196Ω(1960),±1%,0603,C22899
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.05KΩ(2051),±1%,0603,C22900
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.15KΩ(2151),±1%,0603,C22901
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.1KΩ(2101),±1%,0603,C22902
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.21KΩ(2211),±1%,0603,C22903
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.26KΩ(2261),±1%,0603,C22904
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.32KΩ(2321),±1%,0603,C22905
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.43KΩ(2431),±1%,0603,C22906
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.87KΩ(2871),±1%,0603,C22907
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.49KΩ(2491),±1%,0603,C22908
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.94KΩ(2941),±1%,0603,C22909
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20.5KΩ(2052),±1%,0603,C22910
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 21.5KΩ(2152),±1%,0603,C22911
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.7KΩ(2372),±1%,0603,C22912
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 232KΩ(2323),±1%,0603,C22913
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 237KΩ(2373),±1%,0603,C22914
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.3Ω(24R3),±1%,0603,C22915
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.9Ω(24R9),±1%,0603,C22916
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 243Ω(2430),±1%,0603,C22917
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 249KΩ(2493),±1%,0603,C22918
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 249Ω(2490),±1%,0603,C22919
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 25.5KΩ(2552),±1%,0603,C22920
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 25.5Ω(25R5),±1%,0603,C22921
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.1Ω(26R1),±1%,0603,C22922
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.7KΩ(2672),±1%,0603,C22923
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 267Ω(2670),±1%,0603,C22924
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 261Ω(2610),±1%,0603,C22925
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27.4Ω(27R4),±1%,0603,C22926
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 274Ω(2740),±1%,0603,C22927
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28.7KΩ(2872),±1%,0603,C22928
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 287Ω(2870),±1%,0603,C22929
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 196KΩ(1963),±1%,0603,C22930
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.6Ω(19R6),±1%,0603,C22931
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 191KΩ(1913),±1%,0603,C22932
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.1Ω(19R1),±1%,0603,C22933
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1MΩ,(1004),±1%,0603,C22935
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1Ω,(1R00),±1%,0603,C22936
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2MΩ,(2204),±1%,0603,C22938
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2Ω,(2R20),±1%,0603,C22939
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4KΩ,(2401),±1%,0603,C22940
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4Ω(2R40),±1%,0603,C22941
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.61KΩ(2611),±1%,0603,C22942
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.67KΩ(2671),±1%,0603,C22943
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.74KΩ(2741),±1%,0603,C22944
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7Ω,(2R70),±1%,0603,C22946
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.8KΩ(2801),±1%,0603,C22947
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20.5Ω(20R5),±1%,0603,C22948
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 205KΩ(2053),±1%,0603,C22949
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20Ω,(20R0),±1%,0603,C22950
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 21.5Ω(21R5),±1%,0603,C22951
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 210KΩ(2103),±1%,0603,C22952
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 210Ω(2100),±1%,0603,C22953
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 215KΩ(2153),±1%,0603,C22954
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 215Ω(2150),±1%,0603,C22955
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 21KΩ(2102),±1%,0603,C22956
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 21Ω(21R0),±1%,0603,C22957
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.1Ω(22R1),±1%,0603,C22958
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.6KΩ(2262),±1%,0603,C22959
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.6Ω(22R6),±1%,0603,C22960
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220KΩ,(2203),±1%,0603,C22961
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220Ω,(2200),±1%,0603,C22962
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 267KΩ(2673),±1%,0603,C22963
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27.4KΩ(2742),±1%,0603,C22964
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270KΩ,(2703),±1%,0603,C22965
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270Ω,(2700),±1%,0603,C22966
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27KΩ,(2702),±1%,0603,C22967
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 274KΩ(2743),±1%,0603,C22968
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28.7Ω(28R7),±1%,0603,C22969
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 280KΩ(2803),±1%,0603,C22970
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 280Ω(2800),±1%,0603,C22971
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 287KΩ(2873),±1%,0603,C22972
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28Ω(28R0),±1%,0603,C22973
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 29.4KΩ(2942),±1%,0603,C22974
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2KΩ,(2001),±1%,0603,C22975
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2MΩ,(2004),±1%,0603,C22976
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2Ω,(2R00),±1%,0603,C22977
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3KΩ,(3301),±1%,0603,C22978
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3Ω,(3R30),±1%,0603,C22979
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6KΩ,(3601),±1%,0603,C22980
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6MΩ(3604),±1%,0603,C22981
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.83KΩ(3831),±1%,0603,C22982
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 309Ω(3090),±1%,0603,C22983
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30KΩ,(3002),±1%,0603,C22984
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30Ω(30R0),±1%,0603,C22985
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 31.6Ω(31R6),±1%,0603,C22986
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 316Ω(3160),±1%,0603,C22987
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 32.4Ω(32R4),±1%,0603,C22988
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28KΩ(2802),±1%,0603,C22989
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 294Ω(2940),±1%,0603,C22990
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.01KΩ(3011),±1%,0603,C22991
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.09KΩ(3091),±1%,0603,C22992
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.16KΩ(3161),±1%,0603,C22993
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.24KΩ(3241),±1%,0603,C22994
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.32KΩ(3321),±1%,0603,C22995
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.48KΩ(3481),±1%,0603,C22996
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.4KΩ(3401),±1%,0603,C22997
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.57KΩ(3571),±1%,0603,C22998
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.65KΩ(3651),±1%,0603,C22999
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.1KΩ(3012),±1%,0603,C23000
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 309KΩ(3093),±1%,0603,C23001
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 324Ω(3240),±1%,0603,C23002
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33.2KΩ(3322),±1%,0603,C23003
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33.2Ω(33R2),±1%,0603,C23004
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 348Ω(3480),±1%,0603,C23005
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 348KΩ(3483),±1%,0603,C23006
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 332Ω(3320),±1%,0603,C23007
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34KΩ(3402),±1%,0603,C23008
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 232Ω(2320),±1%,0603,C23009
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.7Ω(26R7),±1%,0603,C23010
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 261KΩ(2613),±1%,0603,C23011
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 237Ω(2370),±1%,0603,C23012
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.7Ω(23R7),±1%,0603,C23013
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 205Ω(2050),±1%,0603,C23014
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6Ω(3R60),±1%,0603,C23015
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.74KΩ(3741),±1%,0603,C23016
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.92KΩ(3921),±1%,0603,C23017
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9KΩ,(3901),±1%,0603,C23018
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9MΩ(3904),±1%,0603,C23019
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9Ω,(3R90),±1%,0603,C23020
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.1Ω(30R1),±1%,0603,C23021
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.9KΩ(3092),±1%,0603,C23022
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.9Ω(30R9),±1%,0603,C23023
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300KΩ,(3003),±1%,0603,C23024
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300Ω,(3000),±1%,0603,C23025
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 301KΩ(3013),±1%,0603,C23026
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 35.7KΩ(3572),±1%,0603,C23027
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 357Ω(3570),±1%,0603,C23028
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36.5KΩ(3652),±1%,0603,C23029
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36.5Ω(36R5),±1%,0603,C23030
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 365KΩ(3653),±1%,0603,C23031
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 365Ω(3650),±1%,0603,C23032
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 37.4KΩ(3742),±1%,0603,C23033
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 38.3KΩ(3832),±1%,0603,C23034
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 38.3Ω(38R3),±1%,0603,C23035
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 383Ω(3830),±1%,0603,C23036
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39.2KΩ(3922),±1%,0603,C23037
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39.2Ω(39R2),±1%,0603,C23038
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 392Ω(3920),±1%,0603,C23039
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.12KΩ(4121),±1%,0603,C23041
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.22KΩ(4221),±1%,0603,C23042
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.42KΩ(4421),±1%,0603,C23043
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.64KΩ(4641),±1%,0603,C23044
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.87KΩ(4871),±1%,0603,C23045
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.99KΩ,(4991),±1%,0603,C23046
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 40.2Ω(40R2),±1%,0603,C23047
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 402KΩ(4023),±1%,0603,C23048
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 402Ω(4020),±1%,0603,C23049
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 412KΩ(4123),±1%,0603,C23050
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 412Ω(4120),±1%,0603,C23051
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 422Ω(4220),±1%,0603,C23052
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43.2KΩ(4322),±1%,0603,C23053
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43.2Ω(43R2),±1%,0603,C23054
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 432Ω(4320),±1%,0603,C23055
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 44.2KΩ(4422),±1%,0603,C23056
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 442Ω(4420),±1%,0603,C23057
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 45.3KΩ(4532),±1%,0603,C23058
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 46.4KΩ(4642),±1%,0603,C23059
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 464Ω(4640),±1%,0603,C23060
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47.5KΩ(4752),±1%,0603,C23061
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47.5Ω(47R5),±1%,0603,C23062
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 48.7KΩ(4872),±1%,0603,C23063
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 487Ω(4870),±1%,0603,C23064
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 499Ω(4990),±1%,0603,C23065
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.11KΩ(5111),±1%,0603,C23067
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.23KΩ(5231),±1%,0603,C23068
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.49KΩ(5491),±1%,0603,C23069
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.76KΩ(5761),±1%,0603,C23070
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.9KΩ(5901),±1%,0603,C23071
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51.1KΩ(5112),±1%,0603,C23072
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51.1Ω(51R1),±1%,0603,C23073
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 53.6KΩ(5362),±1%,0603,C23074
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 53.6Ω(53R6),±1%,0603,C23075
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 523KΩ(5233),±1%,0603,C23076
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 54.9KΩ(5492),±1%,0603,C23077
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 54.9Ω(54R9),±1%,0603,C23078
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 549Ω(5490),±1%,0603,C23079
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56.2KΩ(5622),±1%,0603,C23080
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 562Ω(5620),±1%,0603,C23081
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 57.6KΩ(5762),±1%,0603,C23082
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 57.6Ω(57R6),±1%,0603,C23083
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 590Ω(5900),±1%,0603,C23084
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 59KΩ(5902),±1%,0603,C23085
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 59Ω(59R0),±1%,0603,C23086
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.34KΩ(6341),±1%,0603,C23087
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.49KΩ(6491),±1%,0603,C23088
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 60.4KΩ(6042),±1%,0603,C23089
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 60.4Ω(60R4),±1%,0603,C23090
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 61.9KΩ(6192),±1%,0603,C23091
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 61.9Ω(61R9),±1%,0603,C23092
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 63.4KΩ(6342),±1%,0603,C23093
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 634Ω(6340),±1%,0603,C23094
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 649Ω(6490),±1%,0603,C23095
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 665Ω(6650),±1%,0603,C23096
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68.1Ω(68R1),±1%,0603,C23097
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 69.8KΩ(6982),±1%,0603,C23098
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 69.8Ω(69R8),±1%,0603,C23099
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 698Ω(6980),±1%,0603,C23100
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.32KΩ(7321),±1%,0603,C23101
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.68KΩ(7681),±1%,0603,C23102
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 71.5KΩ(7152),±1%,0603,C23103
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 71.5Ω(71R5),±1%,0603,C23104
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 73.2Ω(73R2),±1%,0603,C23105
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 732Ω(7320),±1%,0603,C23106
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 76.8KΩ(7682),±1%,0603,C23107
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 768Ω(7680),±1%,0603,C23108
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 78.7KΩ(7872),±1%,0603,C23109
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 78.7Ω(78R7),±1%,0603,C23110
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 787Ω(7870),±1%,0603,C23111
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.06KΩ(8061),±1%,0603,C23112
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.25KΩ(8251),±1%,0603,C23113
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.66KΩ(8661),±1%,0603,C23114
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 80.6Ω(80R6),±1%,0603,C23115
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 806Ω(8060),±1%,0603,C23116
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82.5Ω(82R5),±1%,0603,C23117
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 84.5KΩ(8452),±1%,0603,C23118
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 84.5Ω(84R5),±1%,0603,C23119
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 845Ω(8450),±1%,0603,C23120
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 86.6KΩ(8662),±1%,0603,C23121
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 86.6Ω(86R6),±1%,0603,C23122
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 866Ω(8660),±1%,0603,C23123
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 88.7Ω(88R7),±1%,0603,C23124
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.09KΩ(9091),±1%,0603,C23125
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.31KΩ(9311),±1%,0603,C23126
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.53KΩ(9531),±1%,0603,C23127
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.76KΩ(9761),±1%,0603,C23128
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 90.9KΩ(9092),±1%,0603,C23129
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 90.9Ω(90R9),±1%,0603,C23130
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 909Ω(9090),±1%,0603,C23131
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 93.1Ω(93R1),±1%,0603,C23132
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 931Ω(9310),±1%,0603,C23133
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 97.6Ω(97R6),±1%,0603,C23134
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 976Ω(9760),±1%,0603,C23135
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330KΩ,(3303),±1%,0603,C23137
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330Ω,(3300),±1%,0603,C23138
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 332KΩ(3323),±1%,0603,C23139
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33Ω,(33R0),±1%,0603,C23140
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34.8KΩ(3482),±1%,0603,C23141
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34.8Ω(34R8),±1%,0603,C23142
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 340KΩ(3403),±1%,0603,C23143
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 340Ω(3400),±1%,0603,C23144
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 357KΩ(3573),±1%,0603,C23145
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 360KΩ,(3603),±1%,0603,C23146
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36KΩ,(3602),±1%,0603,C23147
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36Ω(36R0),±1%,0603,C23148
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 374Ω(3740),±1%,0603,C23149
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390KΩ,(3903),±1%,0603,C23150
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390Ω,(3900),±1%,0603,C23151
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 392KΩ(3923),±1%,0603,C23152
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39KΩ,(3902),±1%,0603,C23153
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39Ω,(39R0),±1%,0603,C23154
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3MΩ,(3004),±1%,0603,C23156
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3Ω(3R00),±1%,0603,C23157
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.32KΩ(4321),±1%,0603,C23158
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3KΩ,(4301),±1%,0603,C23159
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3MΩ(4304),±1%,0603,C23160
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3Ω(4R30),±1%,0603,C23161
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7KΩ,(4701),±1%,0603,C23162
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7MΩ,(4704),±1%,0603,C23163
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7Ω,(4R70),±1%,0603,C23164
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.99Ω(4R99),±1%,0603,C23165
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 41.2KΩ(4122),±1%,0603,C23166
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 42.2KΩ(4222),±1%,0603,C23167
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 42.2Ω(42R2),±1%,0603,C23168
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 422KΩ(4223),±1%,0603,C23169
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 430Ω,(4300),±1%,0603,C23170
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 432KΩ(4323),±1%,0603,C23171
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43KΩ,(4302),±1%,0603,C23172
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43Ω(43R0),±1%,0603,C23173
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 44.2Ω(44R2),±1%,0603,C23174
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 442KΩ(4423),±1%,0603,C23175
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 45.3Ω(45R3),±1%,0603,C23176
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 464KΩ(4643),±1%,0603,C23177
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470KΩ,(4703),±1%,0603,C23178
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470Ω,(4700),±1%,0603,C23179
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 475KΩ(4753),±1%,0603,C23180
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 475Ω(4750),±1%,0603,C23181
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47Ω,(47R0),±1%,0603,C23182
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 487KΩ(4873),±1%,0603,C23183
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 49.9KΩ,(4992),±1%,0603,C23184
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 49.9Ω,(49R9),±1%,0603,C23185
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1KΩ,(5101),±1%,0603,C23186
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.62KΩ(5621),±1%,0603,C23188
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6KΩ,(5601),±1%,0603,C23189
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6MΩ(5604),±1%,0603,C23190
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6Ω,(5R60),±1%,0603,C23191
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 510KΩ,(5103),±1%,0603,C23192
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 510Ω,(5100),±1%,0603,C23193
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 511KΩ(5113),±1%,0603,C23194
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 511Ω(5110),±1%,0603,C23195
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51KΩ,(5102),±1%,0603,C23196
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51Ω,(51R0),±1%,0603,C23197
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 52.3KΩ(5232),±1%,0603,C23198
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 523Ω(5230),±1%,0603,C23199
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 536KΩ(5363),±1%,0603,C23200
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 536Ω(5360),±1%,0603,C23201
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56.2Ω(56R2),±1%,0603,C23202
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560KΩ,(5603),±1%,0603,C23203
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560Ω,(5600),±1%,0603,C23204
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 562KΩ(5623),±1%,0603,C23205
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56KΩ,(5602),±1%,0603,C23206
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 576KΩ(5763),±1%,0603,C23207
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 590KΩ(5903),±1%,0603,C23208
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2Ω(6R20),±1%,0603,C23210
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.81KΩ(6811),±1%,0603,C23211
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8KΩ,(6801),±1%,0603,C23212
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8MΩ(6804),±1%,0603,C23213
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8Ω,(6R80),±1%,0603,C23214
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.98KΩ(6981),±1%,0603,C23215
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 604KΩ(6043),±1%,0603,C23216
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 619KΩ(6193),±1%,0603,C23217
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 619Ω(6190),±1%,0603,C23218
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 620KΩ,(6203),±1%,0603,C23219
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 620Ω,(6200),±1%,0603,C23220
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62KΩ,(6202),±1%,0603,C23221
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62Ω(62R0),±1%,0603,C23222
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 63.4Ω(63R4),±1%,0603,C23223
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 64.9Ω(64R9),±1%,0603,C23224
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 66.5KΩ(6652),±1%,0603,C23225
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 66.5Ω(66R5),±1%,0603,C23226
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 665KΩ(6653),±1%,0603,C23227
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680Ω,(6800),±1%,0603,C23228
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 681KΩ(6813),±1%,0603,C23229
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 681Ω(6810),±1%,0603,C23230
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68KΩ,(6802),±1%,0603,C23231
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 698KΩ(6983),±1%,0603,C23233
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5KΩ,(7501),±1%,0603,C23234
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5Ω(7R50),±1%,0603,C23235
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.87KΩ(7871),±1%,0603,C23236
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 715KΩ(7153),±1%,0603,C23237
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 715Ω(7150),±1%,0603,C23238
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 732KΩ(7323),±1%,0603,C23239
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 750KΩ,(7503),±1%,0603,C23240
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 750Ω,(7500),±1%,0603,C23241
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 75KΩ,(7502),±1%,0603,C23242
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 76.8Ω(76R8),±1%,0603,C23243
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 768KΩ(7683),±1%,0603,C23244
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 787KΩ(7873),±1%,0603,C23245
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2Ω,(8R20),±1%,0603,C23247
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.87KΩ(8871),±1%,0603,C23248
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 80.6KΩ(8062),±1%,0603,C23249
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 806KΩ(8063),±1%,0603,C23250
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82.5KΩ(8252),±1%,0603,C23251
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820KΩ(8203),±1%,0603,C23252
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820Ω,(8200),±1%,0603,C23253
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82KΩ,(8202),±1%,0603,C23254
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82Ω,(82R0),±1%,0603,C23255
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 845KΩ(8453),±1%,0603,C23256
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 866KΩ(8663),±1%,0603,C23257
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 88.7KΩ(8872),±1%,0603,C23258
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 887KΩ(8873),±1%,0603,C23259
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.1KΩ,(9101),±1%,0603,C23260
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.1Ω(9R10),±1%,0603,C23261
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 909KΩ(9093),±1%,0603,C23262
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 910KΩ(9103),±1%,0603,C23263
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 910Ω,(9100),±1%,0603,C23264
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 91KΩ,(9102),±1%,0603,C23265
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 93.1KΩ(9312),±1%,0603,C23266
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 95.3KΩ(9532),±1%,0603,C23267
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 95.3Ω(95R3),±1%,0603,C23268
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 97.6KΩ(9762),±1%,0603,C23269
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 221KΩ(2213),±1%,0603,C23341
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 221Ω(2210),±1%,0603,C23342
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 226Ω(2260),±1%,0603,C23343
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22Ω,(22R0),±1%,0603,C23345
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.2KΩ(2322),±1%,0603,C23346
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.2Ω(23R2),±1%,0603,C23347
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.3KΩ(2432),±1%,0603,C23348
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 240Ω,(2400),±1%,0603,C23350
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 243KΩ(2433),±1%,0603,C23351
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24KΩ,(2402),±1%,0603,C23352
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 255KΩ(2553),±1%,0603,C23354
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 255Ω(2550),±1%,0603,C23355
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.1KΩ(2612),±1%,0603,C23356
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.33Ω(R330),±1%,0603,C23410
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.47Ω(R470),±1%,0603,C23411
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.43Ω(R430),±1%,0805,C24082
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.3Ω(R300),±1%,0805,C24084
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1KΩ(1001),±0.1%,0603,C241300
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.12Ω(R120),±1%,1206,C24435
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.18Ω(R180),±1%,1206,C24436
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.09Ω(9R09),±1%,0402,C245838
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 953KΩ(9533),±1%,0603,C246846
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 931KΩ(9313),±1%,0603,C246847
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 48.7Ω(48R7),±1%,0603,C246848
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 46.4Ω(46R4),±1%,0603,C246849
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 41.2Ω(41R2),±1%,0603,C246850
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 324KΩ(3243),±1%,0603,C246851
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.2KΩ(3022),±1%,0603,C246852
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 29.8KΩ(2982),±1%,0603,C246853
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 29.4Ω(29R4),±1%,0603,C246854
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9KΩ(9001),±1%,0805,C247026
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 90Ω(90R0),±1%,0805,C247027
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 90KΩ(9002),±1%,0805,C247028
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 900KΩ(9003),±1%,0805,C247029
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 649Ω(6490),±1%,0805,C247030
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 634KΩ(6343),±1%,0805,C247031
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 35.7KΩ(3572),±1%,0805,C247032
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34.8KΩ(3482),±1%,0805,C247033
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.9Ω(30R9),±1%,0805,C247034
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.1Ω(30R1),±1%,0805,C247035
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 294Ω(2940),±1%,0805,C247036
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 280Ω(2800),±1%,0805,C247037
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 237Ω(2370),±1%,0805,C247038
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 226KΩ(2263),±1%,0805,C247039
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 215KΩ(2153),±1%,0805,C247040
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 191Ω(1910),±1%,0805,C247041
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.6Ω(19R6),±1%,0805,C247042
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 158Ω(1580),±1%,0805,C247043
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 143KΩ(1433),±1%,0805,C247044
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.06MΩ(8064),±1%,0603,C247045
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.15Ω(7R15),±1%,0603,C247046
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.04Ω(6R04),±1%,0603,C247047
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.49Ω(5R49),±1%,0603,C247048
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.99MΩ(4994),±1%,0603,C247049
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.75Ω(4R75),±1%,0603,C247050
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.42Ω(4R42),±1%,0603,C247051
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.4Ω(3R4),±1%,0603,C247052
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.49Ω(2R49),±1%,0603,C247053
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.69MΩ(1694),±1%,0603,C247054
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.47Ω(1R47),±1%,0603,C247055
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.33Ω(1R33),±1%,0603,C247056
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.05Ω(1R05),±1%,0603,C247057
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.05MΩ(1054),±1%,0603,C247058
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9Ω(9R00),±1%,0805,C247071
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.76Ω(9R76),±1%,0805,C247072
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.53Ω(9R53),±1%,0805,C247073
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.06Ω(8R06),±1%,0805,C247074
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.15Ω(7R15),±1%,0805,C247075
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.98Ω(6R98),±1%,0805,C247076
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.49Ω(6R49),±1%,0805,C247077
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.76Ω(5R76),±1%,0805,C247078
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.36Ω(5R36),±1%,0805,C247079
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.11Ω(5R11),±1%,0805,C247080
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.99MΩ(4994),±1%,0805,C247081
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.87Ω(4R87),±1%,0805,C247082
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.75Ω(4R75),±1%,0805,C247083
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.64Ω(4R64),±1%,0805,C247084
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.53Ω(4R53),±1%,0805,C247085
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.32Ω(4R32),±1%,0805,C247086
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.22Ω(4R22),±1%,0805,C247087
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.12Ω(4R12),±1%,0805,C247088
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.02MΩ(4024),±1%,0805,C247089
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.92Ω(3R92),±1%,0805,C247090
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.83Ω(3R83),±1%,0805,C247091
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.57Ω(3R57),±1%,0805,C247092
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.4Ω(3R4),±1%,0805,C247093
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.48Ω(3R48),±1%,0805,C247094
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.32Ω(3R32),±1%,0805,C247095
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.16Ω(3R16),±1%,0805,C247096
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.01Ω(3R01),±1%,0805,C247097
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.87Ω(2R87),±1%,0805,C247098
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.61Ω(2R61),±1%,0805,C247099
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.43Ω(2R43),±1%,0805,C247100
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.21Ω(2R21),±1%,0805,C247101
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.21MΩ(2214),±1%,0805,C247102
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.05Ω(2R05),±1%,0805,C247103
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.96Ω(1R96),±1%,0805,C247104
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.82Ω(1R82),±1%,0805,C247105
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.65Ω(1R65),±1%,0805,C247106
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.62Ω(1R62),±1%,0805,C247107
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.58Ω(1R58),±1%,0805,C247108
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.54Ω(1R54),±1%,0805,C247109
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.43Ω(1R43),±1%,0805,C247110
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.24Ω(1R24),±1%,0805,C247111
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.18Ω(1R18),±1%,0805,C247112
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.07Ω(1R07),±1%,0805,C247113
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.05Ω(1R05),±1%,0805,C247114
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 619KΩ(6193),±1%,0402,C247117
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 340Ω(3400),±1%,0402,C247118
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 316Ω(3160),±1%,0402,C247119
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 221Ω(2210),±1%,0402,C247122
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 127Ω(1270),±1%,0402,C247127
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.7Ω(12R7),±1%,0402,C247128
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.4Ω(0R40),±1%,0805,C247134
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.36Ω(0R36),±1%,0805,C247135
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.3Ω(0R3),±1%,0603,C247136
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.24Ω(0R24),±1%,0603,C247137
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.18Ω(0R18),±1%,0603,C247138
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.12Ω(0R12),±1%,0603,C247139
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.11Ω(0R11),±1%,0603,C247140
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8MΩ(685),±5%,1206,C247142
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43Ω(430),±5%,1206,C247144
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18Ω(180),±5%,1206,C247146
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6MΩ(165),±5%,1206,C247152
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.24Ω(0R24),±1%,0805,C247159
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.45Ω(8R45),±1%,0402,C247161
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6Ω(5R6),±1%,0402,C247162
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.3Ω(1R3),±1%,0402,C247163
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 976KΩ(9763),±1%,1206,C247164
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 97.6Ω(97R6),±1%,1206,C247165
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 97.6KΩ(9762),±1%,1206,C247166
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 95.3Ω(95R3),±1%,1206,C247167
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 931KΩ(9313),±1%,1206,C247168
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 93.1Ω(93R1),±1%,1206,C247169
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 93.1KΩ(9312),±1%,1206,C247170
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 909KΩ(9093),±1%,1206,C247171
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 90.9KΩ(9092),±1%,1206,C247172
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.31KΩ(9311),±1%,1206,C247173
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 887Ω(8870),±1%,1206,C247174
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 887KΩ(8873),±1%,1206,C247175
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 88.7Ω(88R7),±1%,1206,C247176
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 88.7KΩ(8872),±1%,1206,C247177
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 866KΩ(8663),±1%,1206,C247178
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 845Ω(8450),±1%,1206,C247179
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 845KΩ(8453),±1%,1206,C247180
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 825Ω(8250),±1%,1206,C247181
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 825KΩ(8253),±1%,1206,C247182
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82.5Ω(82R5),±1%,1206,C247183
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 80.6Ω(80R6),±1%,1206,C247184
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.45KΩ(8451),±1%,1206,C247185
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.25KΩ(8251),±1%,1206,C247186
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 787Ω(7870),±1%,1206,C247187
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 787KΩ(7873),±1%,1206,C247188
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 78.7KΩ(7872),±1%,1206,C247189
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 768Ω(7680),±1%,1206,C247190
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 768KΩ(7683),±1%,1206,C247191
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 76.8Ω(76R8),±1%,1206,C247192
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 76.8KΩ(7682),±1%,1206,C247193
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 73.2Ω(73R2),±1%,1206,C247194
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 73.2KΩ(7322),±1%,1206,C247195
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 715Ω(7150),±1%,1206,C247196
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 715KΩ(7153),±1%,1206,C247197
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 71.5Ω(71R5),±1%,1206,C247198
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.32KΩ(7321),±1%,1206,C247199
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 698Ω(6980),±1%,1206,C247200
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 698KΩ(6983),±1%,1206,C247201
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 69.8KΩ(6982),±1%,1206,C247202
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 681Ω(6810),±1%,1206,C247203
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 681KΩ(6813),±1%,1206,C247204
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68.1Ω(68R1),±1%,1206,C247205
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 66.5Ω(66R5),±1%,1206,C247206
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 66.5KΩ(6652),±1%,1206,C247207
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 649Ω(6490),±1%,1206,C247208
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 649KΩ(6493),±1%,1206,C247209
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 634KΩ(6343),±1%,1206,C247210
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 63.4KΩ(6342),±1%,1206,C247211
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 619Ω(6190),±1%,1206,C247212
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 61.9Ω(61R9),±1%,1206,C247213
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 61.9KΩ(6192),±1%,1206,C247214
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 604Ω(6040),±1%,1206,C247215
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 604KΩ(6043),±1%,1206,C247216
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.98KΩ(6981),±1%,1206,C247217
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.65KΩ(6651),±1%,1206,C247218
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.19KΩ(6191),±1%,1206,C247219
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.04KΩ(6041),±1%,1206,C247220
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 59Ω(59R0),±1%,1206,C247221
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 59KΩ(5902),±1%,1206,C247222
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 590Ω(5900),±1%,1206,C247223
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 590KΩ(5903),±1%,1206,C247224
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 576Ω(5760),±1%,1206,C247225
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 576KΩ(5763),±1%,1206,C247226
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 57.6KΩ(5762),±1%,1206,C247227
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 562Ω(5620),±1%,1206,C247228
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 562KΩ(5623),±1%,1206,C247229
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56.2Ω(56R2),±1%,1206,C247230
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 549Ω(5490),±1%,1206,C247231
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 548KΩ(5483),±1%,1206,C247232
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 54.9KΩ(5492),±1%,1206,C247234
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 536KΩ(5363),±1%,1206,C247235
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 523Ω(5230),±1%,1206,C247236
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 523KΩ(5233),±1%,1206,C247237
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 52.3Ω(52R3),±1%,1206,C247238
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 52.3KΩ(5232),±1%,1206,C247239
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 511Ω(5110),±1%,1206,C247240
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51.1KΩ(5112),±1%,1206,C247241
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.9KΩ(5901),±1%,1206,C247242
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.62KΩ(5621),±1%,1206,C247243
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.49KΩ(5491),±1%,1206,C247244
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 487Ω(4870),±1%,1206,C247245
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 487KΩ(4873),±1%,1206,C247246
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 48.7Ω(48R7),±1%,1206,C247247
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 48.7KΩ(4872),±1%,1206,C247248
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 475Ω(4750),±1%,1206,C247249
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 464Ω(4640),±1%,1206,C247250
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 46.4KΩ(4642),±1%,1206,C247251
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 453KΩ(4533),±1%,1206,C247252
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 45.3Ω(45R3),±1%,1206,C247253
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 442KΩ(4423),±1%,1206,C247255
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 44.2Ω(44R2),±1%,1206,C247256
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 44.2KΩ(4422),±1%,1206,C247257
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 432Ω(4320),±1%,1206,C247258
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 432KΩ(4323),±1%,1206,C247259
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43.2Ω(43R2),±1%,1206,C247260
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 422Ω(4220),±1%,1206,C247261
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 422KΩ(4223),±1%,1206,C247262
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 42.2Ω(42R2),±1%,1206,C247263
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 412Ω(4120),±1%,1206,C247264
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 412KΩ(4123),±1%,1206,C247265
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 41.2Ω(41R2),±1%,1206,C247266
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 41.2KΩ(4122),±1%,1206,C247267
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 402Ω(4020),±1%,1206,C247268
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.87KΩ(4871),±1%,1206,C247269
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.64KΩ(4641),±1%,1206,C247270
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.32KΩ(4321),±1%,1206,C247271
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.12KΩ(4121),±1%,1206,C247272
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 392Ω(3920),±1%,1206,C247273
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 392KΩ(3923),±1%,1206,C247274
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39.2Ω(39R2),±1%,1206,C247275
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39.2KΩ(3922),±1%,1206,C247276
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 383KΩ(3833),±1%,1206,C247277
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 38.3KΩ(3832),±1%,1206,C247278
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 374Ω(3740),±1%,1206,C247279
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 37.4Ω(37R4),±1%,1206,C247280
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 365KΩ(3653),±1%,1206,C247282
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36.5Ω(36R5),±1%,1206,C247283
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36.5KΩ(3652),±1%,1206,C247284
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 35.7KΩ(3572),±1%,1206,C247285
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34Ω(34R0),±1%,1206,C247286
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 348Ω(3480),±1%,1206,C247287
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 348KΩ(3483),±1%,1206,C247288
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34.8Ω(34R8),±1%,1206,C247289
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34.8KΩ(3482),±1%,1206,C247290
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 332Ω(3320),±1%,1206,C247291
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 324Ω(3240),±1%,1206,C247293
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 324KΩ(3243),±1%,1206,C247294
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 32.4Ω(32R4),±1%,1206,C247295
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 32.4KΩ(3242),±1%,1206,C247296
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 316KΩ(3163),±1%,1206,C247297
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 31.6Ω(31R6),±1%,1206,C247298
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 309Ω(3090),±1%,1206,C247299
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 301Ω(3010),±1%,1206,C247300
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.9Ω(30R9),±1%,1206,C247301
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.83KΩ(3831),±1%,1206,C247302
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.65KΩ(3651),±1%,1206,C247303
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.4KΩ(3401),±1%,1206,C247304
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.09KΩ(3091),±1%,1206,C247305
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 294KΩ(2943),±1%,1206,C247306
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 29.4Ω(29R4),±1%,1206,C247307
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 29.4KΩ(2942),±1%,1206,C247308
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 287Ω(2870),±1%,1206,C247309
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 280KΩ(2803),±1%,1206,C247310
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28.7Ω(28R7),±1%,1206,C247311
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28.7KΩ(2872),±1%,1206,C247312
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 274Ω(2740),±1%,1206,C247313
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 274KΩ(2743),±1%,1206,C247314
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27.4Ω(27R4),±1%,1206,C247315
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27.4KΩ(2742),±1%,1206,C247316
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 267Ω(2670),±1%,1206,C247317
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 267KΩ(2673),±1%,1206,C247318
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 261KΩ(2613),±1%,1206,C247320
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.7Ω(26R7),±1%,1206,C247321
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.7KΩ(2672),±1%,1206,C247322
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.1KΩ(2612),±1%,1206,C247323
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 25.5Ω(25R5),±1%,1206,C247324
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 243Ω(2430),±1%,1206,C247325
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 243KΩ(2433),±1%,1206,C247326
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.3Ω(24R3),±1%,1206,C247327
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.3KΩ(2432),±1%,1206,C247328
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 237Ω(2370),±1%,1206,C247329
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 232Ω(2320),±1%,1206,C247330
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.7Ω(23R7),±1%,1206,C247331
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.7KΩ(2372),±1%,1206,C247332
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.2KΩ(2322),±1%,1206,C247333
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 226Ω(2260),±1%,1206,C247334
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.6KΩ(2262),±1%,1206,C247335
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.1Ω(22R1),±1%,1206,C247336
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.1KΩ(2212),±1%,1206,C247337
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 215Ω(2150),±1%,1206,C247338
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 215KΩ(2153),±1%,1206,C247339
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 210KΩ(2103),±1%,1206,C247340
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 205Ω(2050),±1%,1206,C247341
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 205KΩ(2053),±1%,1206,C247342
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20.5KΩ(2052),±1%,1206,C247343
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.87KΩ(2871),±1%,1206,C247344
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.67KΩ(2671),±1%,1206,C247345
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.55KΩ(2551),±1%,1206,C247346
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.43KΩ(2431),±1%,1206,C247347
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.32KΩ(2321),±1%,1206,C247348
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.26KΩ(2261),±1%,1206,C247349
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.15KΩ(2151),±1%,1206,C247350
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.05KΩ(2051),±1%,1206,C247351
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 196Ω(1960),±1%,1206,C247352
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 191Ω(1910),±1%,1206,C247353
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.6Ω(19R6),±1%,1206,C247354
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.6KΩ(1962),±1%,1206,C247355
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 187Ω(1870),±1%,1206,C247356
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 187KΩ(1873),±1%,1206,C247357
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 182Ω(1820),±1%,1206,C247358
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 178KΩ(1783),±1%,1206,C247360
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 174KΩ(1743),±1%,1206,C247361
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.8Ω(17R8),±1%,1206,C247362
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.8KΩ(1782),±1%,1206,C247363
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.4Ω(17R4),±1%,1206,C247364
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.4KΩ(1742),±1%,1206,C247365
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 169KΩ(1693),±1%,1206,C247366
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 165KΩ(1653),±1%,1206,C247367
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 162Ω(1620),±1%,1206,C247368
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 162KΩ(1623),±1%,1206,C247369
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.9Ω(16R9),±1%,1206,C247370
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.2KΩ(1622),±1%,1206,C247371
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 158Ω(1580),±1%,1206,C247372
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 158KΩ(1583),±1%,1206,C247373
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.8Ω(15R8),±1%,1206,C247374
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.4Ω(15R4),±1%,1206,C247375
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.4KΩ(1542),±1%,1206,C247376
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 147Ω(1470),±1%,1206,C247377
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 143KΩ(1433),±1%,1206,C247378
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.7Ω(14R7),±1%,1206,C247379
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.3Ω(14R3),±1%,1206,C247381
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.3KΩ(1432),±1%,1206,C247382
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 137Ω(1370),±1%,1206,C247383
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.7Ω(13R7),±1%,1206,C247384
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.3Ω(13R3),±1%,1206,C247385
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 127KΩ(1273),±1%,1206,C247386
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 124KΩ(1243),±1%,1206,C247387
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.7Ω(12R7),±1%,1206,C247388
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.7KΩ(1272),±1%,1206,C247389
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.1Ω(12R1),±1%,1206,C247390
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.1KΩ(1212),±1%,1206,C247391
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 118Ω(1180),±1%,1206,C247392
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 115Ω(1150),±1%,1206,C247393
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 115KΩ(1153),±1%,1206,C247394
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 113Ω(1130),±1%,1206,C247395
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 113KΩ(1133),±1%,1206,C247396
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.8Ω(11R8),±1%,1206,C247397
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.8KΩ(1182),±1%,1206,C247398
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.5Ω(11R5),±1%,1206,C247399
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.3Ω(11R3),±1%,1206,C247400
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 107Ω(1070),±1%,1206,C247401
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 107KΩ(1073),±1%,1206,C247402
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 105Ω(1050),±1%,1206,C247403
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 105KΩ(1053),±1%,1206,C247404
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 102Ω(1020),±1%,1206,C247405
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 102KΩ(1023),±1%,1206,C247406
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.7Ω(10R7),±1%,1206,C247407
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.7KΩ(1072),±1%,1206,C247408
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.5Ω(10R5),±1%,1206,C247409
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.2KΩ(1022),±1%,1206,C247410
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.96KΩ(1961),±1%,1206,C247411
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.91KΩ(1911),±1%,1206,C247412
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.82KΩ(1821),±1%,1206,C247413
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.78KΩ(1781),±1%,1206,C247414
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.74KΩ(1741),±1%,1206,C247415
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.69KΩ(1691),±1%,1206,C247416
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.62KΩ(1621),±1%,1206,C247417
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.54KΩ(1541),±1%,1206,C247418
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.43KΩ(1431),±1%,1206,C247420
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.27KΩ(1271),±1%,1206,C247421
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.21KΩ(1211),±1%,1206,C247422
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.15KΩ(1151),±1%,1206,C247423
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.07KΩ(1071),±1%,1206,C247424
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.05KΩ(1051),±1%,1206,C247425
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.14Ω(0R14),±1%,0805,C247445
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15MΩ(156),±5%,1206,C247451
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.14Ω(R14),±5%,1206,C247455
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.76Ω(9R76),±1%,1206,C247460
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.53Ω(9R53),±1%,1206,C247461
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.31Ω(9R31),±1%,1206,C247462
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.09Ω(9R09),±1%,1206,C247463
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.87Ω(8R87),±1%,1206,C247464
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.66Ω(8R66),±1%,1206,C247465
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2MΩ(8204),±1%,1206,C247466
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.25Ω(8R25),±1%,1206,C247467
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.06Ω(8R06),±1%,1206,C247468
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.87Ω(7R87),±1%,1206,C247469
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5MΩ(7504),±1%,1206,C247470
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.32Ω(7R32),±1%,1206,C247471
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.15Ω(7R15),±1%,1206,C247472
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.98Ω(6R98),±1%,1206,C247473
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.65Ω(6R65),±1%,1206,C247474
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.49Ω(6R49),±1%,1206,C247475
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.34Ω(6R34),±1%,1206,C247476
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.19Ω(6R19),±1%,1206,C247477
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.04Ω(6R04),±1%,1206,C247478
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.76Ω(5R76),±1%,1206,C247479
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6MΩ(5604),±1%,1206,C247480
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.62Ω(5R62),±1%,1206,C247481
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.49Ω(5R49),±1%,1206,C247482
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.36Ω(5R36),±1%,1206,C247483
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.11Ω(5R11),±1%,1206,C247484
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.87Ω(4R87),±1%,1206,C247486
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.75Ω(4R75),±1%,1206,C247487
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.64Ω(4R64),±1%,1206,C247488
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.53Ω(4R53),±1%,1206,C247489
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.42Ω(4R42),±1%,1206,C247490
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.32Ω(4R32),±1%,1206,C247491
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.12Ω(4R12),±1%,1206,C247492
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.92Ω(3R92),±1%,1206,C247493
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.83Ω(3R83),±1%,1206,C247494
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.65Ω(3R65),±1%,1206,C247495
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.57Ω(3R57),±1%,1206,C247496
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.4Ω(3R4),±1%,1206,C247497
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.48Ω(3R48),±1%,1206,C247498
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.32Ω(3R32),±1%,1206,C247499
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.01Ω(3R01),±1%,1206,C247500
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.8MΩ(2804),±1%,1206,C247501
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.74Ω(2R74),±1%,1206,C247502
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.55Ω(2R55),±1%,1206,C247503
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.37Ω(2R37),±1%,1206,C247504
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.21Ω(2R21),±1%,1206,C247505
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.1Ω(2R10),±1%,1206,C247506
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.15Ω(2R15),±1%,1206,C247507
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.05Ω(2R05),±1%,1206,C247508
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.96Ω(1R96),±1%,1206,C247509
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.87Ω(1R87),±1%,1206,C247510
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.82Ω(1R82),±1%,1206,C247511
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.78Ω(1R78),±1%,1206,C247512
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6MΩ(1604),±1%,1206,C247513
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.58Ω(1R58),±1%,1206,C247514
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.54Ω(1R54),±1%,1206,C247515
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.47Ω(1R47),±1%,1206,C247516
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.47MΩ(1474),±1%,1206,C247517
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.21Ω(1R21),±1%,1206,C247518
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.18Ω(1R18),±1%,1206,C247519
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.13Ω(1R13),±1%,1206,C247520
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.022Ω(R022),±5%,1206,C247539
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 127Ω(1270),±1%,1206,C24883
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100Ω(101),±5%,2512,C24920
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.43Ω(R430),±1%,1206,C24965
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.47Ω(R470),±1%,0805,C25040
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100Ω,(1000),±1%,0402,C25076
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10Ω,(10R0),±1%,0402,C25077
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 110Ω(1100),±1%,0402,C25078
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120Ω,(1200),±1%,0402,C25079
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 121Ω(1210),±1%,0402,C25080
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 140Ω(1400),±1%,0402,C25081
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150Ω,(1500),±1%,0402,C25082
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15Ω(15R0),±1%,0402,C25083
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18Ω(18R0),±1%,0402,C25084
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 191Ω(1910),±1%,0402,C25085
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1Ω,(1R00),±1%,0402,C25086
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200Ω,(2000),±1%,0402,C25087
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 205Ω(2050),±1%,0402,C25088
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20Ω(20R0),±1%,0402,C25089
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 210Ω(2100),±1%,0402,C25090
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220Ω,(2200),±1%,0402,C25091
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22Ω,(22R0),±1%,0402,C25092
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.6Ω(22R6),±1%,0402,C25093
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 240Ω(2400),±1%,0402,C25094
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 243Ω(2430),±1%,0402,C25095
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 249Ω(2490),±1%,0402,C25096
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 261Ω(2610),±1%,0402,C25097
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.1Ω(26R1),±1%,0402,C25098
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270Ω(2700),±1%,0402,C25099
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27Ω(27R0),±1%,0402,C25100
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2Ω(2R20),±1%,0402,C25101
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300Ω,(3000),±1%,0402,C25102
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 301Ω(3010),±1%,0402,C25103
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330Ω,(3300),±1%,0402,C25104
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33Ω,(33R0),±1%,0402,C25105
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33.2Ω(33R2),±1%,0402,C25106
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 348Ω(3480),±1%,0402,C25107
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 37.4Ω(37R4),±1%,0402,C25108
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390Ω(3900),±1%,0402,C25109
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39Ω(39R0),±1%,0402,C25110
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 40.2Ω(40R2),±1%,0402,C25111
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 412Ω(4120),±1%,0402,C25112
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 432Ω(4320),±1%,0402,C25113
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43.2Ω(43R2),±1%,0402,C25114
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 44.2Ω(44R2),±1%,0402,C25115
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 464Ω(4640),±1%,0402,C25116
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470Ω,(4700),±1%,0402,C25117
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47Ω,(47R0),±1%,0402,C25118
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 49.9Ω,(49R9),±1%,0402,C25120
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7Ω(4R70),±1%,0402,C25121
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.99Ω(4R99),±1%,0402,C25122
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 510Ω,(5100),±1%,0402,C25123
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 511Ω(5110),±1%,0402,C25124
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51Ω,(51R0),±1%,0402,C25125
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560Ω(5600),±1%,0402,C25126
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56Ω(56R0),±1%,0402,C25127
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1Ω(5R10),±1%,0402,C25128
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 665Ω(6650),±1%,0402,C25129
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680Ω,(6800),±1%,0402,C25130
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68Ω(68R0),±1%,0402,C25131
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 750Ω(7500),±1%,0402,C25132
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 75Ω,(75R0),±1%,0402,C25133
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 80.6Ω(80R6),±1%,0402,C25134
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820Ω(8200),±1%,0402,C25135
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82Ω(82R0),±1%,0402,C25136
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 93.1Ω(93R1),±1%,0402,C25137
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180Ω,(181),±5%,0402,C25145
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.39Ω(R390),±1%,0603,C25183
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11Ω(11R0),±1%,0603,C25184
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16Ω(16R0),±1%,0603,C25185
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 191Ω(1910),±1%,0603,C25186
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.3Ω(1R30),±1%,0603,C25188
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.65Ω(1R65),±1%,0603,C25189
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27Ω,(27R0),±1%,0603,C25190
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 301Ω(3010),±1%,0603,C25192
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34Ω(34R0),±1%,0603,C25193
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 360Ω,(3600),±1%,0603,C25194
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 37.4Ω(37R4),±1%,0603,C25195
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56Ω,(56R0),±1%,0603,C25196
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1Ω,(5R10),±1%,0603,C25197
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 91Ω,(91R0),±1%,0603,C25199
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.76Ω(9R76),±1%,0603,C25200
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.56Ω(R560),±1%,0805,C25266
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.82Ω(R820),±1%,0805,C25267
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13Ω(13R0),±1%,0805,C25268
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 160Ω(1600),±1%,0805,C25269
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180Ω,(1800),±1%,0805,C25270
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1Ω,(1R00),±1%,0805,C25271
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6Ω(1R60),±1%,0805,C25272
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.99Ω(4R99),±1%,0805,C25273
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 59Ω(59R0),±1%,0805,C25274
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300Ω,(301),±5%,0805,C25304
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 360Ω,(361),±5%,0805,C25308
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820Ω,(821),±5%,0805,C25328
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82Ω,(820),±5%,0805,C25329
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.1Ω,(R100),±1%,1206,C25334
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.2Ω(R200),±1%,1206,C25335
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.22Ω(R220),±1%,1206,C25336
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.33Ω,±1%,1206,C25337
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.36Ω(R360),±1%,1206,C25338
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.39Ω(R390),±1%,1206,C25339
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.5Ω(R500),±1%,1206,C25340
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.62Ω(R620),±1%,1206,C25341
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 140Ω(1400),±1%,1206,C25342
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2Ω(6R20),±1%,1206,C25344
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8Ω(6R80),±1%,1206,C25345
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 91Ω(91R0),±1%,1206,C25346
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12Ω(120),±5%,1206,C25352
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15Ω(150),±5%,1206,C25354
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2Ω(1R2),±5%,1206,C25358
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5Ω(1R5),±5%,1206,C25359
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.8Ω(1R8),±5%,1206,C25360
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27Ω(270),±5%,1206,C25367
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4Ω(2R4),±5%,1206,C25370
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7Ω(2R7),±5%,1206,C25371
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33Ω(330),±5%,1206,C25375
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390Ω(391),±5%,1206,C25378
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3Ω(3R3),±5%,1206,C25381
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9Ω(3R9),±5%,1206,C25382
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470Ω(471),±5%,1206,C25383
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47Ω(470),±5%,1206,C25384
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6Ω(5R6),±5%,1206,C25390
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2Ω(8R2),±5%,1206,C25397
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30Ω(300),±5%,1210,C25423
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.25Ω(R250),±1%,2512,C25467
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.33Ω(R330),±1%,2512,C25468
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150Ω(151),±5%,2512,C25471
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.8Ω,(1R8),±5%,2512,C25473
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24Ω,(240),±5%,2512,C25476
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270Ω,(271),±5%,2512,C25477
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27Ω,(270),±5%,2512,C25478
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 49.9Ω,(49R9),±1%,2512,C25487
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51Ω(510),±5%,2512,C25490
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 75Ω,(750),±5%,2512,C25493
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220KΩ,(224),±5%,0402,C25546
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2KΩ,(202),±5%,0402,C25552
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30KΩ,(303),±5%,0402,C25553
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330KΩ,(334),±5%,0402,C25554
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 910KΩ,(914),±5%,0402,C25572
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 91KΩ,(913),±5%,0402,C25573
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3KΩ(302),±5%,1206,C25662
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15KΩ(153),±5%,1812,C25713
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100KΩ,(1003),±1%,0402,C25741
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 105KΩ(1053),±1%,0402,C25742
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 107KΩ(1073),±1%,0402,C25743
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10KΩ,(1002),±1%,0402,C25744
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 110KΩ(1103),±1%,0402,C25745
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 113KΩ(1133),±1%,0402,C25746
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 115KΩ(1153),±1%,0402,C25747
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 118KΩ(1183),±1%,0402,C25748
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11KΩ(1102),±1%,0402,C25749
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120KΩ,(1203),±1%,0402,C25750
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 127KΩ(1273),±1%,0402,C25751
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12KΩ,(1202),±1%,0402,C25752
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 133KΩ(1333),±1%,0402,C25753
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13KΩ(1302),±1%,0402,C25754
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150KΩ,(1503),±1%,0402,C25755
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15KΩ,(1502),±1%,0402,C25756
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 160KΩ(1603),±1%,0402,C25757
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 169KΩ(1693),±1%,0402,C25758
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16KΩ(1602),±1%,0402,C25759
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180KΩ(1803),±1%,0402,C25760
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 187KΩ(1873),±1%,0402,C25761
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18KΩ,(1802),±1%,0402,C25762
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200KΩ,(2003),±1%,0402,C25764
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20KΩ,(2002),±1%,0402,C25765
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 21KΩ(2102),±1%,0402,C25766
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220KΩ,(2203),±1%,0402,C25767
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22KΩ,(2202),±1%,0402,C25768
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24KΩ,(2402),±1%,0402,C25769
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270KΩ(2703),±1%,0402,C25770
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27KΩ,(2702),±1%,0402,C25771
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28KΩ(2802),±1%,0402,C25772
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300KΩ,(3003),±1%,0402,C25774
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 301KΩ(3013),±1%,0402,C25775
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30KΩ(3002),±1%,0402,C25776
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 316KΩ(3163),±1%,0402,C25777
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330KΩ,(3303),±1%,0402,C25778
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33KΩ,(3302),±1%,0402,C25779
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 348KΩ(3483),±1%,0402,C25780
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 374KΩ(3743),±1%,0402,C25781
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390KΩ(3903),±1%,0402,C25782
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39KΩ,(3902),±1%,0402,C25783
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3KΩ(3001),±1%,0402,C25784
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 402KΩ(4023),±1%,0402,C25785
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 430KΩ(4303),±1%,0402,C25786
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 432KΩ(4323),±1%,0402,C25787
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 464KΩ(4643),±1%,0402,C25789
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470KΩ,(4703),±1%,0402,C25790
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 475KΩ(4753),±1%,0402,C25791
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47KΩ,(4702),±1%,0402,C25792
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 499KΩ(4993),±1%,0402,C25793
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51KΩ,(5102),±1%,0402,C25794
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 549KΩ(5493),±1%,0402,C25795
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56KΩ,(5602),±1%,0402,C25796
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 681KΩ(6813),±1%,0402,C25797
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 75KΩ,(7502),±1%,0402,C25798
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 909KΩ(9093),±1%,0402,C25799
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 910KΩ(9103),±1%,0402,C25800
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 953KΩ(9533),±1%,0402,C25801
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 976KΩ(9763),±1%,0402,C25802
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100KΩ,(1003),±1%,0603,C25803
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10KΩ,(1002),±1%,0603,C25804
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 110KΩ,(1103),±1%,0603,C25805
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 118KΩ(1183),±1%,0603,C25806
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120KΩ,(1203),±1%,0603,C25808
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 121KΩ(1213),±1%,0603,C25809
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18KΩ,(1802),±1%,0603,C25810
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200KΩ,(2003),±1%,0603,C25811
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 294KΩ(2943),±1%,0603,C25813
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 316KΩ(3163),±1%,0603,C25814
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 374KΩ(3743),±1%,0603,C25815
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 383KΩ(3833),±1%,0603,C25816
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 453KΩ(4533),±1%,0603,C25818
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47KΩ,(4702),±1%,0603,C25819
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 549KΩ(5493),±1%,0603,C25820
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 649KΩ(6493),±1%,0603,C25821
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680KΩ,(6803),±1%,0603,C25822
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 825KΩ(8253),±1%,0603,C25823
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 240KΩ,(2403),±1%,0805,C25824
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 249KΩ(2493),±1%,0805,C25825
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39KΩ,(3902),±1%,0805,C25826
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 620KΩ(6203),±1%,0805,C25827
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15KΩ(1502),±1%,1206,C25828
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16KΩ(1602),±1%,1206,C25829
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22KΩ(2202),±1%,1206,C25830
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28KΩ(2802),±1%,1206,C25831
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 402KΩ(4023),±1%,1206,C25832
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47KΩ(4702),±1%,1206,C25833
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68KΩ(6802),±1%,1206,C25834
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 750KΩ(7503),±1%,1206,C25835
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.5KΩ(1052),±1%,0402,C25850
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.3KΩ(1132),±1%,0402,C25851
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.1KΩ(1212),±1%,0402,C25852
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.7KΩ(1272),±1%,0402,C25853
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.7KΩ(1372),±1%,0402,C25854
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.3KΩ(1432),±1%,0402,C25855
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14.7KΩ(1472),±1%,0402,C25856
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.5KΩ(1652),±1%,0402,C25857
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.9KΩ(1692),±1%,0402,C25858
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18.2KΩ(1822),±1%,0402,C25859
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.1KΩ(1101),±1%,0402,C25860
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2KΩ,(1201),±1%,0402,C25862
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.21KΩ(1211),±1%,0402,C25863
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.24KΩ(1241),±1%,0402,C25864
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.27KΩ(1271),±1%,0402,C25865
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.3KΩ(1301),±1%,0402,C25866
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5KΩ,(1501),±1%,0402,C25867
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.65KΩ(1651),±1%,0402,C25869
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.69KΩ(1691),±1%,0402,C25870
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.8KΩ(1801),±1%,0402,C25871
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 21.5KΩ(2152),±1%,0402,C25872
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.2KΩ(2322),±1%,0402,C25873
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.9KΩ(2492),±1%,0402,C25874
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.1KΩ(2612),±1%,0402,C25875
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.7KΩ(2672),±1%,0402,C25876
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.1KΩ(2101),±1%,0402,C25877
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.15KΩ(2151),±1%,0402,C25878
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2KΩ,(2201),±1%,0402,C25879
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.21KΩ(2211),±1%,0402,C25880
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.37KΩ(2371),±1%,0402,C25881
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4KΩ,(2401),±1%,0402,C25882
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.43KΩ(2431),±1%,0402,C25883
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.49KΩ(2491),±1%,0402,C25884
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7KΩ(2701),±1%,0402,C25885
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.94KΩ(2941),±1%,0402,C25886
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36.5KΩ(3652),±1%,0402,C25887
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 37.4KΩ(3742),±1%,0402,C25888
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.01KΩ(3011),±1%,0402,C25889
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3KΩ,(3301),±1%,0402,C25890
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6KΩ(3601),±1%,0402,C25891
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.92KΩ(3921),±1%,0402,C25892
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 40.2KΩ(4022),±1%,0402,C25893
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43.2KΩ(4322),±1%,0402,C25894
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 44.2KΩ(4422),±1%,0402,C25895
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47.5KΩ(4752),±1%,0402,C25896
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 49.9KΩ,(4992),±1%,0402,C25897
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.22KΩ(4221),±1%,0402,C25898
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3KΩ(4301),±1%,0402,C25899
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7KΩ,(4701),±1%,0402,C25900
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.75KΩ(4751),±1%,0402,C25901
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.87KΩ(4871),±1%,0402,C25902
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.99KΩ(4991),±1%,0402,C25903
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51.1KΩ(5112),±1%,0402,C25904
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1KΩ,(5101),±1%,0402,C25905
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.11KΩ(5111),±1%,0402,C25906
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.23KΩ(5231),±1%,0402,C25907
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6KΩ,(5601),±1%,0402,C25908
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.62KΩ(5621),±1%,0402,C25909
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.76KΩ(5761),±1%,0402,C25910
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 60.4KΩ(6042),±1%,0402,C25911
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 61.9KΩ(6192),±1%,0402,C25912
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.04KΩ(6041),±1%,0402,C25913
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.19KΩ(6191),±1%,0402,C25914
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2KΩ(6201),±1%,0402,C25915
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.49KΩ(6491),±1%,0402,C25916
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8KΩ,(6801),±1%,0402,C25917
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5KΩ,(7501),±1%,0402,C25918
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.68KΩ(7681),±1%,0402,C25919
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.87KΩ(7871),±1%,0402,C25920
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 80.6KΩ(8062),±1%,0402,C25921
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 88.7KΩ(8872),±1%,0402,C25922
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.06KΩ(8061),±1%,0402,C25923
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2KΩ,(8201),±1%,0402,C25924
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 93.1KΩ(9312),±1%,0402,C25925
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.1KΩ(9101),±1%,0402,C25926
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.3KΩ,(132),±5%,0402,C25929
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5KΩ,(752),±5%,0402,C25945
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2KΩ,(822),±5%,0402,C25946
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.1KΩ,(912),±5%,0402,C25947
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.5KΩ(1152),±1%,0603,C25949
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11KΩ,(1102),±1%,0603,C25950
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.3KΩ(1332),±1%,0603,C25952
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.9KΩ(1692),±1%,0603,C25954
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.24KΩ(1241),±1%,0603,C25956
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.4KΩ(1401),±1%,0603,C25957
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.82KΩ(1821),±1%,0603,C25958
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.1KΩ(2212),±1%,0603,C25961
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.9KΩ(2492),±1%,0603,C25962
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.37KΩ(2371),±1%,0603,C25964
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.55KΩ(2551),±1%,0603,C25965
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 31.6KΩ(3162),±1%,0603,C25967
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 430KΩ,(4303),±1%,0603,C25969
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.53KΩ(4531),±1%,0603,C25971
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.75KΩ(4751),±1%,0603,C25972
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.36KΩ(5361),±1%,0603,C25973
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68.1KΩ(6812),±1%,0603,C25976
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.04KΩ(6041),±1%,0603,C25977
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.19KΩ(6191),±1%,0603,C25978
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.15KΩ(7151),±1%,0603,C25980
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2KΩ,(8201),±1%,0603,C25981
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.74KΩ(2741),±1%,0805,C26009
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3KΩ,(3301),±1%,0805,C26010
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47.5KΩ(4752),±1%,0805,C26011
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 78.7KΩ(7872),±1%,0805,C26012
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.4KΩ(1401),±1%,1206,C26029
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5KΩ(1501),±1%,1206,C26030
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 21.5KΩ(2152),±1%,1206,C26031
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3KΩ(3301),±1%,1206,C26032
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1KΩ(5101),±1%,1206,C26033
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8KΩ(6801),±1%,1206,C26034
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7KΩ(472),±5%,1210,C26060
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10MΩ,(1005),±1%,0402,C26082
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1MΩ,(1004),±1%,0402,C26083
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.02MΩ(1024),±1%,0402,C26084
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7MΩ(2704),±1%,0603,C26095
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3MΩ(3304),±1%,0603,C26096
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10MΩ,(1005),±1%,0805,C26108
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.3MΩ(1304),±1%,0805,C26109
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5MΩ,(1504),±1%,0805,C26110
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6MΩ(1604),±1%,0805,C26111
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2MΩ,(2004),±1%,0805,C26112
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2MΩ,(2204),±1%,0805,C26113
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1MΩ,(5104),±1%,0805,C26114
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3MΩ,(305),±5%,0805,C26117
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10MΩ(1005),±1%,1206,C26119
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2MΩ(2004),±1%,1206,C26120
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2MΩ(2204),±1%,1206,C26121
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4MΩ(2404),±1%,1206,C26122
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3MΩ(3004),±1%,1206,C26123
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20MΩ(206),±5%,1206,C26125
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9MΩ(395),±5%,1206,C26126
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.07KΩ(1071),±1%,0402,C26260
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 240Ω(2400),±1%,2512,C26428
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 499KΩ(4993),±1%,0603,C26751
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.8KΩ(1582),±1%,0402,C26956
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.4KΩ(1742),±1%,0402,C26957
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.6KΩ(1962),±1%,0402,C26959
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.6KΩ(2262),±1%,0402,C26960
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.3KΩ(2432),±1%,0402,C26969
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 25.5KΩ(2552),±1%,0402,C26970
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27.4KΩ(2742),±1%,0402,C26971
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 28.7KΩ(2872),±1%,0402,C26972
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 29.4KΩ(2942),±1%,0402,C26973
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 32.4KΩ(3242),±1%,0402,C26974
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 35.7KΩ(3572),±1%,0402,C26975
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 38.3KΩ(3832),±1%,0402,C26976
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 41.2KΩ(4122),±1%,0402,C26978
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 42.2KΩ(4222),±1%,0402,C26979
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 45.3KΩ(4532),±1%,0402,C26980
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 48.7KΩ(4872),±1%,0402,C26981
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 52.3KΩ(5232),±1%,0402,C26982
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 57.6KΩ(5762),±1%,0402,C26983
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 64.9KΩ(6492),±1%,0402,C26984
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 69.8KΩ(6982),±1%,0402,C26985
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 73.2KΩ(7322),±1%,0402,C26986
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 76.8KΩ(7682),±1%,0402,C26987
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 84.5KΩ(8452),±1%,0402,C26988
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 90.9KΩ(9092),±1%,0402,C26989
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 95.3KΩ(9532),±1%,0402,C26990
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 102KΩ(1023),±1%,0402,C26991
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 154KΩ(1543),±1%,0402,C26993
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 174KΩ(1743),±1%,0402,C26994
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 178KΩ(1783),±1%,0402,C26995
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 196KΩ(1963),±1%,0402,C26996
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 205KΩ(2053),±1%,0402,C26997
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 221KΩ(2213),±1%,0402,C26998
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 226KΩ(2263),±1%,0402,C26999
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 232KΩ(2323),±1%,0402,C27000
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 237KΩ(2373),±1%,0402,C27001
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 261KΩ(2613),±1%,0402,C27003
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 274KΩ(2743),±1%,0402,C27004
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 357KΩ(3573),±1%,0402,C27005
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 365KΩ(3653),±1%,0402,C27006
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 392KΩ(3923),±1%,0402,C27007
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 412KΩ(4123),±1%,0402,C27008
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 453KΩ(4533),±1%,0402,C27009
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 487KΩ(4873),±1%,0402,C27010
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 523KΩ(5233),±1%,0402,C27011
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 576KΩ(5763),±1%,0402,C27012
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 604KΩ(6043),±1%,0402,C27013
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 634kΩ,(6343),±1%,0402,C27014
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 698KΩ(6983),±1%,0402,C27015
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 732KΩ(7323),±1%,0402,C27016
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 768KΩ(7683),±1%,0402,C27017
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 787KΩ(7873),±1%,0402,C27018
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 845kΩ,(8453),±1%,0402,C27019
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 866KΩ(8663),±1%,0402,C27020
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 931KΩ(9313),±1%,0402,C27021
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.49KΩ(6491),±1%,0402,C270374
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 240Ω(2400),±1%,0402,C270375
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.21KΩ(2211),±1%,0402,C270376
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2KΩ(2001),±1%,0402,C270377
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 133Ω(1330),±1%,0402,C270378
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 110KΩ(1103),±1%,0402,C270379
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100KΩ(1003),±1%,0402,C270380
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10KΩ(1002),±1%,0402,C270381
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1KΩ(1001),±1%,0402,C270382
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.76KΩ(9761),±1%,0402,C270420
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 95.3Ω(95R3),±1%,0402,C270571
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.31KΩ(9311),±1%,0402,C270572
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.1Ω(9R10),±1%,0402,C270573
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 91Ω(91R0),±1%,0402,C270574
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 86.6Ω(86R6),±1%,0402,C270575
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.66KΩ(8661),±1%,0402,C270576
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 84.5Ω(84R5),±1%,0402,C270577
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 845KΩ(8453),±1%,0402,C270578
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.45KΩ(8451),±1%,0402,C270579
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2Ω(8R20),±1%,0402,C270581
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 787Ω(7870),±1%,0402,C270582
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 76.8Ω(76R8),±1%,0402,C270583
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 71.5Ω(71R5),±1%,0402,C270584
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 715KΩ(7153),±1%,0402,C270585
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.15KΩ(7151),±1%,0402,C270586
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68.1Ω(68R1),±1%,0402,C270587
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 634KΩ(6343),±1%,0402,C270588
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2Ω(6R20),±1%,0402,C270589
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 620KΩ(6203),±1%,0402,C270590
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.9KΩ(5901),±1%,0402,C270591
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 523Ω(5230),±1%,0402,C270592
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.11Ω(5R11),±1%,0402,C270593
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51.1Ω(51R1),±1%,0402,C270594
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1MΩ(5104),±1%,0402,C270595
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.99MΩ(4994),±1%,0402,C270596
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 48.7Ω(48R7),±1%,0402,C270597
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.75MΩ(4754),±1%,0402,C270598
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 453Ω(4530),±1%,0402,C270599
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43Ω(43R0),±1%,0402,C270600
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.22Ω(4R22),±1%,0402,C270601
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 41.2Ω(41R2),±1%,0402,C270602
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.02Ω(4R02),±1%,0402,C270603
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 374Ω(3740),±1%,0402,C270604
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 365Ω(3650),±1%,0402,C270605
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.36Ω(0R36),±1%,0402,C270606
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 360Ω(3600),±1%,0402,C270607
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 35.7Ω(35R7),±1%,0402,C270608
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.57KΩ(3571),±1%,0402,C270609
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34.8Ω(34R8),±1%,0402,C270610
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34Ω(34R0),±1%,0402,C270611
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3Ω(3R30),±1%,0402,C270612
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3MΩ(3304),±1%,0402,C270613
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 32.4Ω(32R4),±1%,0402,C270614
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.9KΩ(3092),±1%,0402,C270615
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 309Ω(3090),±1%,0402,C270616
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30Ω(30R0),±1%,0402,C270617
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 294Ω(2940),±1%,0402,C270618
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 274Ω(2740),±1%,0402,C270620
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7MΩ(2704),±1%,0402,C270621
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 267KΩ(2673),±1%,0402,C270622
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 255KΩ(2553),±1%,0402,C270623
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4Ω(2R40),±1%,0402,C270624
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24Ω(24R0),±1%,0402,C270625
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 232Ω(2320),±1%,0402,C270626
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.26KΩ(2261),±1%,0402,C270627
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.22Ω(R220),±1%,0402,C270628
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.2Ω(0R20),±1%,0402,C270629
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2Ω(2R00),±1%,0402,C270630
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 196Ω(1960),±1%,0402,C270631
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 191KΩ(1913),±1%,0402,C270632
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.87KΩ(1871),±1%,0402,C270633
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 182Ω(1820),±1%,0402,C270634
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.8Ω(1R80),±1%,0402,C270635
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.4Ω(17R4),±1%,0402,C270636
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.74MΩ(1744),±1%,0402,C270637
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.74KΩ(1741),±1%,0402,C270638
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.2Ω(16R2),±1%,0402,C270639
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16Ω(16R0),±1%,0402,C270640
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 160Ω(1600),±1%,0402,C270641
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5Ω(1R50),±1%,0402,C270642
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 143Ω(1430),±1%,0402,C270643
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.4MΩ(1404),±1%,0402,C270644
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 140KΩ(1403),±1%,0402,C270645
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.7Ω(13R7),±1%,0402,C270646
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.33Ω(1R33),±1%,0402,C270647
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.33MΩ(1334),±1%,0402,C270648
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 130Ω(1300),±1%,0402,C270649
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12Ω(12R0),±1%,0402,C270650
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.18KΩ(1181),±1%,0402,C270651
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 118Ω(1180),±1%,0402,C270652
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.5KΩ(1152),±1%,0402,C270653
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.7KΩ(1072),±1%,0402,C270654
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.1Ω(R100),±1%,0402,C270655
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470Ω(4700),±0.5%,0402,C270656
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22KΩ(2202),±0.5%,0402,C270657
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100KΩ(1003),±0.5%,0402,C270658
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7Ω(4R70),±1%,1210,C270827
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6KΩ(3601),±1%,0805,C270841
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 750Ω(7500),±1%,1210,C270878
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0Ω(0000),±1%,1210,C270882
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.4Ω(R400),±1%,1210,C270889
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33KΩ(3302),±1%,1210,C270890
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14Ω(14R0),±1%,1206,C270905
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.36Ω(R360),±1%,0603,C270934
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.16Ω(3R16),±1%,0603,C270935
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.01Ω(3R01),±1%,0603,C270936
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.8Ω(2R80),±1%,0603,C270937
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.8MΩ(2804),±1%,0603,C270938
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.74Ω(2R74),±1%,0603,C270939
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.49MΩ(2494),±1%,0603,C270940
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16MΩ(1605),±1%,0603,C270941
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.14Ω(R140),±1%,0603,C270942
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.4Ω(1R40),±1%,0603,C270943
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.01Ω(R010),±1%,0603,C270944
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 360Ω(3600),±0.5%,0603,C270945
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.001Ω(R001),±1%,2512,C270947
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10KΩ(1002),±1%,2512,C270956
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0Ω(0000),±1%,2512,C270957
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2Ω(8R20),±1%,2010,C270964
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8Ω(6R80),±1%,2010,C270965
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6Ω(5R60),±1%,2010,C270966
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7Ω(4R70),±1%,2010,C270968
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3Ω(3R30),±1%,2010,C270971
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0Ω(0000),±1%,2010,C270974
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330Ω(3300),±1%,1812,C270975
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.81KΩ(6811),±1%,0402,C27175
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.2KΩ(1622),±1%,0402,C27176
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 698Ω(6980),±1%,0805,C27535
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.83KΩ(3831),±1%,0805,C27536
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.67KΩ(2671),±1%,0805,C27571
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68Ω,(68R0),±1%,0603,C27592
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.5Ω(R500),±1%,2512,C27777
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1KΩ,(5101),±1%,0805,C27834
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.27Ω(R270),±1%,0603,C27855
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.43Ω(R430),±1%,0603,C27857
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.51Ω(R510),±1%,0603,C27858
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.56Ω(R560),±1%,0603,C27859
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.62Ω(R620),±1%,0603,C27860
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.68Ω(R680),±1%,0603,C27862
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.75Ω(R750),±1%,0603,C27863
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.82Ω(R820),±1%,0603,C27865
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.91Ω(R910),±1%,0603,C27867
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.5Ω(R500),±1%,0805,C28319
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.47Ω(R470),±1%,1206,C28320
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.8Ω(2R80),±1%,1206,C28420
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560Ω,(5600),±1%,0805,C28636
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8Ω(6R8),±5%,1206,C2884
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 806KΩ(8063),±1%,0402,C29263
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 332Ω(3320),±1%,0402,C29281
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 66.5KΩ(6652),±1%,0402,C29381
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.15KΩ(1151),±1%,0402,C29401
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.1KΩ(3012),±1%,0402,C29402
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.62KΩ(1621),±1%,0805,C30040
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.68KΩ(7681),±1%,0805,C30041
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11Ω(11R0),±1%,2512,C30206
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12Ω(12R0),±1%,2512,C30210
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 226KΩ(2263),±1%,1206,C30273
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20MΩ(2005),±1%,0402,C30328
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9MΩ(3904),±1%,0402,C30329
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51KΩ(5102),±1%,2512,C30412
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150KΩ(1503),±1%,2512,C30413
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 374Ω(3740),±1%,0805,C30515
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 137KΩ(1373),±1%,1206,C30544
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.82Ω(R820),±1%,1206,C30568
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39KΩ(3902),±1%,2512,C30705
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33KΩ(3302),±1%,2512,C30706
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120KΩ(1203),±1%,2512,C30707
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 110KΩ(1103),±1%,2512,C30708
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 64.9Ω(64R9),±1%,1206,C30846
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12.4KΩ(1242),±1%,0805,C30908
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 604Ω(6040),±1%,0603,C31365
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 576Ω(5760),±1%,0603,C31366
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27.4Ω(27R4),±1%,0402,C31439
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.15Ω(215K),±1%,0805,C31608
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1MΩ(1004),±0.1%,0603,C318138
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22KΩ,(2202),±1%,0603,C31850
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3KΩ(332),±5%,2512,C31884
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200KΩ(2003),±1%,2010,C31987
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.55KΩ(2551),±1%,0805,C32136
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 604Ω(6040),±1%,0603,C32183
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 249Ω(2490),±1%,0805,C32281
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 59KΩ(5902),±1%,0402,C32297
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 137KΩ(1373),±1%,0402,C32298
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.32KΩ(3321),±1%,0805,C32391
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20Ω(20R0),±1%,1210,C32486
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3Ω(3R0),±5%,0402,C327280
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 97.6Ω(97R6),±1%,0402,C32980
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 698Ω(6980),±1%,0402,C33359
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.74KΩ(2741),±1%,0402,C33360
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 226KΩ(2263),±1%,0603,C33619
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.32KΩ(3321),±1%,1206,C33886
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.51Ω(R510),±1%,1206,C34068
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.62Ω(R620),±1%,0805,C34142
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3MΩ(3304),±1%,0805,C34154
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.16Ω(R160),±1%,0805,C34388
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 499KΩ(4993),±1%,1206,C34629
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22MΩ(2205),±1%,0805,C34719
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7MΩ(4704),±1%,2512,C34762
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 75Ω(75R0),±1%,2010,C34839
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13KΩ(1302),±1%,1206,C34847
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.61KΩ(2611),±1%,0402,C34906
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5Ω(7R50),±1%,2512,C35217
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100Ω(1000),±1%,2512,C35218
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2Ω(8R20),±1%,2512,C35219
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 931Ω(9310),±1%,0402,C35293
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2Ω(8R20),±1%,1210,C35528
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9MΩ(3904),±1%,0805,C35709
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6MΩ(3604),±1%,0805,C35710
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 162Ω(1620),±1%,0805,C35721
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.32KΩ(7321),±1%,0805,C35729
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.36Ω(360L),±1%,0805,C35793
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36.5KΩ(3652),±1%,0805,C35928
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.5KΩ(1652),±1%,0805,C35929
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.15Ω(0R15),±1%,0805,C36231
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.22Ω(0R22),±1%,0805,C36234
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.12Ω(0R12),±1%,0805,C36235
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 430Ω(4300),±1%,0402,C36356
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36Ω(36R0),±1%,0805,C36524
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 91Ω(91R0),±1%,2512,C36686
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 124KΩ(1243),±1%,0402,C36777
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68KΩ,(6802),±1%,0402,C36871
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2MΩ(625),±5%,1206,C36926
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 32.4KΩ(3242),±1%,0805,C36938
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.91KΩ(1911),±1%,0402,C36951
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.87KΩ(8871),±1%,0402,C36953
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 169Ω(1690),±1%,0402,C36954
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14Ω(14R0),±1%,0603,C37078
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 249KΩ(2493),±1%,1206,C37158
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33.2KΩ(3322),±1%,0805,C37252
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.87KΩ(8871),±1%,0805,C37551
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.24Ω(0R24),±1%,1206,C37599
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560Ω(0561),±5%,0805,C37659
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 510KΩ(5103),±1%,1210,C37784
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7MΩ(4704),±1%,1206,C37800
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20MΩ(2005),±1%,0805,C37801
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62KΩ(6202),±1%,0402,C37825
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200KΩ(204),±5%,1206,C37862
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.15Ω(R150),±1%,1206,C37936
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 732Ω(7320),±1%,0805,C37998
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.68Ω(R680),±1%,0402,C38005
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.4MΩ(1404),±1%,0603,C38070
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 40.2Ω(40R2),±1%,1206,C38337
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8Ω(6R80),±1%,0402,C38373
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5MΩ(755),±5%,1206,C38385
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6MΩ(565),±5%,1206,C38386
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.91Ω(R910),±1%,1206,C38521
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10KΩ(1002),±1%,0805,C38522
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.69MΩ(1694),±1%,0402,C38586
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.8MΩ(1804),±1%,0402,C38587
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 63.4KΩ(6342),±1%,0402,C38606
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 165KΩ(1653),±1%,0402,C38706
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180Ω(1800),±1%,0402,C38941
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2Ω,(6R2),±5%,0805,C39008
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5Ω(1R50),±1%,2512,C39346
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3Ω(3R30),±1%,2512,C39347
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9Ω(3R90),±1%,2512,C39356
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.4KΩ(1401),±1%,0402,C39650
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 124Ω(1240),±1%,0402,C39886
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 187Ω(1870),±1%,0402,C39887
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.5KΩ(1052),±1%,0805,C40086
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 121Ω(1210),±1%,1206,C40089
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43.2KΩ(4322),±1%,0603,C40192
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 64.9Ω(64R9),±1%,1210,C40223
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15Ω(15R0),±1%,2010,C40361
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 102KΩ(1023),±1%,0805,C40372
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1MΩ(515),±5%,1206,C40517
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.48KΩ(3481),±1%,1206,C40574
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7Ω(2R70),±1%,0402,C407695
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6Ω(1R60),±1%,0402,C407711
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1MΩ(5104),±1%,1206,C40823
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 294KΩ(2943),±1%,0402,C40836
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.27KΩ(1271),±1%,0805,C40880
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.01KΩ(3011),±1%,0805,C41006
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 402Ω(4020),±1%,0402,C41042
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2KΩ,(2001),±1%,0402,C4109
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 499Ω(4990),±1%,0402,C4125
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680KΩ(6803),±1%,0402,C4131
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82KΩ(8202),±1%,0402,C4142
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 91KΩ(9102),±1%,0402,C4147
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.2Ω(16R2),±1%,1206,C41712
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5MΩ,(1504),±1%,0603,C4172
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22MΩ(2205),±1%,1206,C41755
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.8KΩ,(1801),±1%,0603,C4177
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20KΩ,(2002),±1%,0603,C4184
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2KΩ,(2201),±1%,0603,C4190
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 80.6KΩ(8062),±1%,0805,C41949
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20Ω(20R0),±1%,2512,C41950
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16MΩ(1605),±1%,0805,C41952
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 240KΩ,(2403),±1%,0603,C4197
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51Ω(51R0),±1%,2512,C41977
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24Ω,(24R0),±1%,0603,C4198
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 430Ω(4300),±1%,0805,C42000
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3KΩ,(3001),±1%,0603,C4211
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33KΩ,(3302),±1%,0603,C4216
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24KΩ,±1%,2512,C421600
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.87KΩ(1871),±1%,0805,C42161
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1MΩ,±1%,1812,C422159
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2KΩ,(6201),±1%,0603,C4260
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 75Ω,(75R0),±1%,0603,C4275
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 35.7KΩ(3572),±1%,0805,C42792
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15MΩ(1505),±1%,0805,C42861
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180Ω(1800),±1%,2010,C42957
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10Ω(10R0),±1%,1812,C42962
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1Ω(1R00),±1%,1812,C42963
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.65KΩ(1651),±1%,1206,C42983
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.81KΩ(6811),±1%,1206,C42985
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47.5KΩ(4752),±1%,1206,C42986
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33.2KΩ(3322),±1%,1206,C42987
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 732KΩ(7323),±1%,1206,C43002
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.09KΩ(9091),±1%,1206,C43003
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 909Ω(9090),±1%,1206,C43004
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.49KΩ(6491),±1%,1206,C43005
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5KΩ,(1501),±1%,0805,C4310
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 243KΩ(2433),±1%,0402,C43249
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.02KΩ(4021),±1%,0402,C43251
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.81MΩ(6814),±1%,0805,C43252
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20KΩ,(2002),±1%,0805,C4328
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.1KΩ(2212),±1%,0402,C43473
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 71.5KΩ(7152),±1%,0402,C43534
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.91MΩ(1914),±1%,1206,C43544
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.68KΩ(7681),±1%,1206,C43546
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 301KΩ(3013),±1%,1206,C43554
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36KΩ,(3602),±1%,0805,C4360
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.5KΩ(1152),±1%,1206,C43670
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2MΩ(1204),±1%,0402,C43675
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36KΩ(3602),±1%,0402,C43676
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43Ω(43R0),±1%,0805,C4368
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 357KΩ(3573),±1%,1206,C43696
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6KΩ,(5601),±1%,0805,C4382
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.2Ω(R200),±1%,0805,C44051
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 91Ω(91R0),±1%,0805,C4407
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1KΩ,(1001),±1%,1206,C4410
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2Ω(1R20),±1%,0402,C44198
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62Ω(62R0),±1%,2512,C44304
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 332KΩ(3323),±1%,0402,C44358
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 160KΩ(1603),±1%,1206,C4437
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 140Ω(1400),±1%,0805,C44385
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10Ω(10R0),±1%,1210,C44451
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390Ω(3900),±1%,1206,C4491
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.3KΩ(1132),±1%,1206,C44912
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 910Ω(9100),±1%,0402,C44933
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9Ω(3R90),±1%,0402,C44937
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.34KΩ(6341),±1%,0402,C45013
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470Ω(4700),±1%,1206,C4502
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 63.4Ω(63R4),±1%,1206,C45027
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 124Ω(1240),±1%,1206,C45030
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 38.3Ω(38R3),±1%,1206,C45041
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.56Ω(R560),±1%,1206,C45165
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.65KΩ(6651),±1%,0402,C45194
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.5Ω(R500),±1%,0603,C45312
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 576Ω(5760),±1%,0402,C45320
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 576Ω(5760),±1%,0603,C45321
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39.2Ω(39R2),±1%,0402,C45323
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 45.3Ω(45R3),±1%,0402,C45325
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 255Ω(2550),±1%,1206,C45424
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6Ω(3R60),±1%,0402,C45432
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 619KΩ(6193),±1%,1206,C45833
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.15Ω(0R15),±1%,0603,C45879
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 360KΩ(3603),±1%,0402,C45956
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 383KΩ(3833),±1%,0402,C45993
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 280KΩ(2803),±1%,0402,C46006
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 590KΩ(5903),±1%,0402,C46007
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.11KΩ(5111),±1%,0805,C46039
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2Ω(1R20),±1%,2512,C46193
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.25Ω(R250),±1%,0805,C46216
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6MΩ(3604),±1%,1206,C46661
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3MΩ(3304),±1%,1206,C46662
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.49Ω(2R49),±1%,1206,C46664
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 25.5KΩ(2552),±1%,0805,C46670
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.49MΩ(2494),±1%,1206,C46821
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10Ω(10R0),±1%,2512,C47019
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 26.1KΩ(2612),±1%,0805,C47183
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.68Ω(R680),±1%,0805,C47389
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.01KΩ(3011),±1%,1206,C47424
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.42KΩ(4421),±1%,1206,C47426
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270Ω(2700),±1%,1210,C47444
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34.8KΩ(3482),±1%,0402,C47493
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.98KΩ(6981),±1%,0402,C47500
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5Ω(7R50),±1%,0402,C47764
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3MΩ(4304),±1%,1206,C47772
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.27Ω(R270),±1%,0805,C47782
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 221Ω(2210),±1%,1206,C47909
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 453Ω(4530),±1%,0603,C48136
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.68Ω(R680),±1%,2512,C48169
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.69KΩ(1691),±1%,0805,C48183
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8Ω(6R80),±1%,2512,C48277
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.18Ω(R180),±1%,2512,C48628
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 137KΩ(1373),±1%,0805,C48674
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3MΩ,(335),±5%,0805,C48769
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 715KΩ(7153),±1%,0805,C48770
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 60.4KΩ(6042),±1%,0805,C48806
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 562KΩ(5623),±1%,0402,C48838
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3Ω(4R30),±1%,2512,C48874
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 976KΩ(9763),±1%,0603,C48922
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.25Ω(8R25),±1%,0402,C48938
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34KΩ(3402),±1%,0402,C48939
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 475Ω(4750),±1%,0402,C49065
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6KΩ(1601),±1%,0402,C4908
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.25Ω(R250),±1%,1206,C49283
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2Ω(2R00),±1%,2512,C49298
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.4KΩ(3401),±1%,0402,C4940
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 620Ω(6200),±1%,0402,C4961
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62Ω(62R0),±1%,0402,C4962
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 71.5KΩ(7152),±1%,1206,C49822
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820KΩ(8203),±1%,0805,C50136
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 825Ω(8250),±1%,0603,C50214
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68Ω(68R0),±1%,2512,C50371
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100Ω(1000),±1%,2010,C50472
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6Ω(3R60),±1%,1210,C50720
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 806KΩ(8063),±1%,1206,C50721
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.27Ω(R270),±1%,1206,C50842
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.9Ω(24R9),±1%,0402,C5099
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 442KΩ(4423),±1%,0402,C5101
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1KΩ(1001),±0.5%,0603,C51218
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.23KΩ(5231),±0.5%,0603,C51223
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 35.7KΩ(3572),±0.5%,0603,C51224
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.96Ω(1R96),±1%,0603,C51613
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9KΩ(3901),±1%,0402,C51721
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.2Ω(16R2),±1%,1210,C51988
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.1KΩ(1912),±1%,0402,C52036
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82.5Ω(82R5),±1%,0402,C52037
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.42KΩ(4421),±1%,0402,C52269
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.2Ω(R200),±1%,1210,C52362
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.1Ω(R100),±1%,1210,C52365
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 46.4KΩ(4642),±1%,0402,C52378
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7KΩ(4701),±1%,1210,C52443
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1KΩ(1001),±1%,1210,C52444
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 357Ω(3570),±1%,0805,C52534
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.33Ω(R330),±1%,0805,C52548
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.16KΩ(3161),±1%,0805,C52603
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100KΩ(1003),±1%,2512,C52842
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 130KΩ(1303),±1%,0402,C52929
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 215Ω(2150),±1%,0402,C52959
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 226Ω(2260),±1%,0402,C52960
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 237Ω(2370),±1%,0402,C52962
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 53.6KΩ(5362),±1%,0402,C53398
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18.2Ω(18R2),±1%,0402,C53516
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34.8KΩ(3482),±1%,0805,C53718
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12MΩ(1205),±1%,0805,C53725
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.9Ω(5R90),±1%,0805,C53726
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33Ω(33R0),±1%,2512,C53728
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.11Ω(R110),±1%,0805,C53899
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 162KΩ(1623),±1%,0402,C54068
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.7KΩ(1372),±1%,1206,C54124
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6KΩ(1601),±1%,2010,C54195
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.4KΩ(1401),±1%,2010,C54203
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18.2KΩ(1822),±1%,1206,C54228
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.1KΩ(3012),±1%,1206,C54229
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 665Ω(6650),±1%,1206,C54230
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.37KΩ(2371),±1%,1206,C54231
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1KΩ(1001),±1%,2512,C54315
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.22Ω(R220),±1%,2512,C54531
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.2MΩ(6204),±1%,0603,C54536
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 14KΩ(1402),±1%,0402,C54831
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.16Ω(R160),±1%,1206,C54892
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56.2KΩ(5622),±1%,0402,C54968
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5Ω(7R50),±1%,1210,C55014
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10Ω(10R0),±1%,2010,C55022
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.57KΩ(3571),±1%,1206,C55074
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62KΩ(6202),±1%,2512,C55093
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.11KΩ(5111),±1%,0805,C55317
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 31.6KΩ(3162),±1%,1206,C55346
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.87KΩ(8871),±1%,1206,C55354
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56Ω(56R0),±1%,2512,C55484
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1MΩ(1004),±1%,2512,C55485
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220KΩ(2203),±1%,2512,C55486
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 130KΩ(1303),±1%,2512,C55487
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6Ω(3R60),±1%,2512,C55502
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470KΩ(4703),±1%,2512,C55559
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 590Ω(5900),±1%,0805,C55566
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.24KΩ(1241),±1%,1206,C55569
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.51Ω(R510),±1%,0805,C55618
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.76KΩ(9761),±1%,1206,C55766
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.27Ω(R270),±1%,1210,C55807
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.62Ω(R620),±1%,1210,C55825
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.43Ω(R430),±1%,1210,C55826
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200Ω(2000),±1%,1210,C55914
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680Ω(6800),±1%,2512,C56080
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100Ω(1000),±1%,1210,C56239
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2KΩ(1201),±1%,2010,C56348
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12MΩ(126),±5%,1206,C56487
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3MΩ(3004),±1%,0402,C56582
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 665KΩ(6653),±1%,0402,C56583
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.56Ω(R560),±1%,2512,C56739
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.82KΩ(1821),±1%,0805,C56827
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20.5KΩ(2052),±1%,0402,C57105
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39.2KΩ(3922),±1%,0402,C57106
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 309KΩ(3093),±1%,0805,C57148
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.4Ω(R400),±1%,0603,C57344
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.22Ω(4R22),±1%,1206,C57568
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 60.4Ω(60R4),±1%,1206,C57572
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.99KΩ(4991),±1%,1206,C57609
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.4Ω(1R40),±1%,0805,C57643
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.91Ω(1R91),±1%,0805,C57644
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9MΩ(3904),±1%,1206,C57647
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36Ω(36R0),±1%,0402,C57678
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.02MΩ(1024),±1%,0805,C57821
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 825KΩ(8253),±1%,0402,C58495
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 280Ω(2800),±1%,2010,C58775
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 210KΩ(2103),±1%,0402,C58827
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 35.7Ω(35R7),±1%,0603,C58837
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39KΩ(3902),±1%,1210,C58849
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3KΩ(3301),±1%,1210,C58850
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 332KΩ(3323),±1%,1206,C58968
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 64.9KΩ(6492),±1%,1210,C59292
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200KΩ(2003),±1%,1210,C59294
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.78MΩ(1784),±1%,0603,C59295
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 34KΩ(3402),±1%,1206,C59575
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22.1Ω(22R1),±1%,0402,C59651
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100MΩ(1006),±1%,1206,C59781
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.3Ω(R300),±1%,1206,C59882
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12MΩ(1205),±1%,0603,C59894
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0805W8F3922T5E,0805,C60005
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.32Ω(3R32),±1%,0402,C60073
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.32KΩ(3321),±1%,0402,C60075
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.05KΩ(2051),±1%,0402,C60076
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.12KΩ(4121),±1%,0402,C60081
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.5Ω(R500),±1%,2010,C60104
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1Ω(1R00),±1%,2010,C60111
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390Ω(3900),±1%,2512,C60131
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.64KΩ(4641),±1%,0402,C60154
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 357Ω(3570),±1%,1206,C60238
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 60.4Ω(60R4),±1%,0402,C60310
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.65KΩ(6651),±1%,0603,C60344
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 422KΩ(4223),±1%,0402,C60390
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.16KΩ(3161),±1%,1206,C60483
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.8KΩ(1782),±1%,0805,C60733
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.13Ω(R130),±1%,1206,C61472
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 76.8Ω(76R8),±1%,0402,C61601
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10KΩ(1002),±1%,2010,C61618
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.87MΩ(1874),±1%,0603,C61679
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.8KΩ(2801),±1%,1206,C61834
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.62KΩ(1621),±1%,0402,C61897
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.1MΩ(1104),±1%,0805,C62137
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 806Ω(8060),±1%,1206,C62206
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.75Ω(R750),±1%,1210,C62271
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 45.3Ω(45R3),±1%,0805,C62325
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22MΩ(0226),±5%,0805,C62398
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 37.4KΩ(3742),±1%,0805,C62728
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.4KΩ(1542),±1%,0402,C62740
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.8KΩ(2801),±1%,0402,C62741
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 97.6KΩ(9762),±1%,0402,C62742
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 255KΩ(2553),±1%,1206,C62953
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 806KΩ(8063),±1%,0805,C63494
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56.2KΩ(5622),±1%,1206,C63497
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.58KΩ(1581),±1%,1206,C63498
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.1KΩ(2101),±1%,1206,C63499
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 365Ω(3650),±1%,0805,C63500
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.53KΩ(9531),±1%,1206,C63503
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.75Ω(R750),±1%,0805,C63832
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 25KΩ(2502),±1%,0805,C63863
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 50KΩ(5002),±1%,0805,C63865
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15.8KΩ(1582),±1%,1206,C63896
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 237KΩ(2373),±1%,1206,C63897
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 511KΩ(5113),±1%,0402,C64042
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 240KΩ(2403),±1%,0402,C64043
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 147KΩ(1473),±1%,0402,C64171
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.43Ω(R430),±1%,2512,C64339
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 147Ω(1470),±1%,0402,C64531
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33.2KΩ(3322),±1%,2512,C65089
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100KΩ(1003),±1%,2010,C65168
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18MΩ(1805),±1%,0805,C65241
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300KΩ(3003),±1%,1812,C65306
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 133Ω(1330),±1%,0402,C65628
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.74KΩ(3741),±1%,0805,C65649
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 634KΩ(6343),±1%,0603,C65831
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.42Ω(4R42),±1%,0805,C65847
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 165KΩ(1653),±1%,0805,C65869
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6Ω(1R60),±1%,0603,C66183
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24.9Ω(24R9),±1%,0805,C66212
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.6Ω,(1R6),±5%,1210,C66578
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.2Ω(23R2),±1%,1206,C66686
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180Ω(1800),±1%,1210,C66696
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.13KΩ(1131),±1%,0402,C67014
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 162Ω(1620),±1%,0402,C67232
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.7Ω(23R7),±1%,0402,C67233
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30.1Ω(30R1),±1%,0402,C67234
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.65KΩ(3651),±1%,0402,C67235
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.83KΩ(3831),±1%,0402,C67236
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 422Ω(4220),±1%,0402,C67237
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56.2Ω(56R2),±1%,0402,C67238
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 78.7KΩ(7872),±1%,0402,C67239
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820KΩ(8203),±1%,0402,C67558
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.25MΩ(8254),±1%,0805,C67619
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 243Ω(2430),±1%,0805,C67632
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9Ω(3R90),±1%,2010,C68084
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20KΩ(2002),±1%,2512,C68384
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.13KΩ(1131),±1%,1206,C68406
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 536K(5363),±1%,0402,C68457
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7Ω(2R70),±1%,1210,C68599
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 71.5Ω(71R5),±1%,2010,C68734
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.47Ω(1R47),±1%,0805,C68930
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43KΩ(4302),±1%,2512,C69400
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3Ω(3R00),±1%,2512,C69478
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.18Ω(R180),±1%,1210,C69866
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.39Ω(0R39),±1%,1210,C69867
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22Ω(22R0),±1%,2010,C70404
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 91Ω(91R0),±1%,1210,C70405
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51Ω(51R0),±1%,1210,C70407
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.96KΩ(1961),±1%,0402,C70427
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 110Ω(1100),±1%,2010,C70992
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.1KΩ(1101),±1%,2010,C70993
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11KΩ(1102),±1%,2010,C70994
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10MΩ(106),±5%,1206,C71009
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.42KΩ(4421),±1%,0805,C71067
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9KΩ(3901),±1%,2512,C71971
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2MΩ(2204),±1%,2512,C72208
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100KΩ(104),±5%,1812,C72209
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.22KΩ(4221),±1%,1206,C72256
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47Ω(47R0),±1%,1210,C72398
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56Ω(56R0),±1%,1210,C72399
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10MΩ,(1005),±1%,0603,C7250
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.48KΩ(3481),±1%,0805,C72936
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 60.4Ω(60R4),±1%,0805,C72998
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 430KΩ,(434),±5%,1206,C73035
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39.2KΩ(3922),±1%,0805,C73038
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 221KΩ(2213),±1%,1206,C73039
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68.1KΩ(6812),±1%,1206,C73040
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270KΩ(2703),±1%,2512,C73112
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1Ω(5R10),±1%,2512,C73113
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 19.1KΩ(1912),±1%,1206,C74154
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 475KΩ(4753),±1%,1206,C74155
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 17.8KΩ(1782),±1%,0805,C75250
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 221KΩ(2213),±1%,0805,C75431
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.53KΩ(4531),±1%,1206,C75577
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.34KΩ(6341),±1%,1206,C75581
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10.5KΩ(1052),±1%,1206,C75582
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 105Ω(1050),±1%,0402,C75737
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.67Ω(2R67),±1%,1206,C76395
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1Ω(5R10),±1%,2010,C76471
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36KΩ,(363),±5%,0805,C76486
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1Ω(1R00),±1%,1210,C78022
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.18Ω(R180),±1%,0805,C78033
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 665KΩ(6653),±1%,1206,C78210
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.39Ω(R390),±1%,0805,C78470
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.65Ω(1R65),±1%,1206,C79297
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3MΩ(335),±5%,1206,C79298
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6MΩ(365),±5%,1206,C79299
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.53KΩ(4531),±1%,0402,C79537
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.2Ω(0R20),±1%,0603,C79773
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 37.4Ω(37R4),±1%,0805,C79787
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15MΩ(1505),±1%,0603,C80615
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.99KΩ(4991),±1%,2512,C81247
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.12Ω(0R12),±1%,2512,C81248
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.74KΩ(2741),±1%,1206,C81250
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15KΩ,(1502),±1%,2512,C81251
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 52.3Ω(52R3),±1%,0603,C81321
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 130KΩ(1303),±1%,1206,C82092
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 60.4KΩ(6042),±1%,1206,C82093
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.7KΩ(2372),±1%,0402,C82134
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200Ω,(2000),±1%,0603,C8218
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16.9Ω(16R9),±1%,0402,C82287
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 69.8Ω(69R8),±1%,0402,C82289
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47.5Ω(47R5),±1%,0402,C82290
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 143KΩ(1433),±1%,0402,C82292
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 29.4Ω(29R4),±1%,0402,C82293
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 649Ω(6490),±1%,0402,C82294
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 73.2Ω(73R2),±1%,0402,C82295
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 23.2Ω(23R2),±1%,0402,C82296
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.32KΩ(2321),±1%,0402,C82297
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.67KΩ(2671),±1%,0402,C82298
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180Ω(1800),±1%,2512,C82626
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43KΩ(4302),±1%,0402,C8329
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39Ω(39R0),±1%,2010,C83487
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.49MΩ(2494),±1%,0805,C83497
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 604Ω(6040),±1%,0402,C8369
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.1MΩ(1104),±1%,1206,C83722
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 191KΩ(1913),±1%,1206,C83723
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 35.7Ω(35R7),±1%,1206,C83725
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.2Ω(R200),±1%,2512,C83749
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.1Ω(1R10),±1%,0603,C83906
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.99MΩ(4994),±1%,1206,C84087
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.1Ω(5R10),±1%,1812,C84642
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 52.3Ω(52R3),±1%,2512,C84674
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.02KΩ(1021),±1%,0402,C85373
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.87Ω(2R87),±1%,1206,C85725
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.94Ω(2R94),±1%,1206,C85726
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 374KΩ(3743),±1%,1206,C86993
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 249Ω(2490),±1%,2010,C88090
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 60.4Ω(60R4),±1%,1210,C90385
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 392Ω(3920),±1%,0402,C92196
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.02Ω(R020),±1%,0805,C92740
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.01Ω(R010),±1%,0805,C92741
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.005Ω(R005),±1%,0805,C92742
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.36Ω(R360),±1%,2010,C92994
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13.3KΩ(1332),±1%,1206,C93144
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3KΩ(432),±5%,2010,C93205
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 887Ω(8870),±1%,0603,C93619
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 953Ω(9530),±1%,0603,C93622
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.36KΩ(5361),±1%,0402,C93751
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11.8KΩ(1182),±1%,0402,C93752
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.58MΩ(1584),±1%,0603,C94830
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 249Ω(2490),±1%,1210,C94903
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.33Ω(0R33),±1%,1210,C95211
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47KΩ(4702),±1%,2512,C95455
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 113Ω(1130),±1%,0402,C95594
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.55KΩ(2551),±1%,0402,C95596
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.25KΩ(8251),±1%,0402,C95598
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 910KΩ(9103),±1%,1812,C96184
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 49.9KΩ(4992),±1%,2512,C96245
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.53KΩ(9531),±1%,0402,C96273
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4Ω(2R40),±1%,2010,C97157
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 110KΩ(114),±5%,1206,C98724
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22Ω(22R0),±1%,1210,C99151
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43Ω(43R0),±1%,1210,C99152
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62Ω(62R0),±1%,1210,C99153
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 158KΩ(1583),±1%,0402,C99856
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2Ω(2R00),±1%,2010,C99964
D test description,
K test key,
F ~
$ENDCMP
#End Doc Library