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appropriability

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nilsdenter / ga_from_semiconductor_patents

This project contains the data and code used in the paper: Denter, N. M., & Lai, M. Y. (2022). Measuring generative appropriability: Experiments with US semiconductor patents. World Patent Information. doi:10.1016/j.wpi.2022.102130. https://www.sciencedirect.com/science/article/pii/S0172219022000369?dgcid=author

nltk patents patent uspto patent-data patentsview-api patentsview appropriability

Updated Aug 21, 2022
Python

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